1. Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Christoph Mahr, Beeke Gerken, Marco Schowalter, Bert Freitag, and Andreas Rosenauer. GaN atomic electric fields from a segmented STEM detector: Experiment and simulation. Journal of Microscopy, n/a(n/a), 2024. Keyword(s): 4D STEM, centre-of-mass, COM, electric fields, GaN, momentum-resolved STEM, segmented STEM detector.



2. Christoph Mahr, Jakob Stahl, Beeke Gerken, Valentin Baric, Max Frei, Florian F. Krause, Tim Grieb, Marco Schowalter, Thorsten Mehrtens, Einar Kruis, Lutz Mädler, and Andreas Rosenauer. Characterization of mixing in nanoparticle hetero-aggregates by convolutional neural networks. Nano Select, 5(4):2300128, 2024. Keyword(s): convolutional neural networks, double flame spray pyrolysis, hetero-aggregate, nanoparticle mixing, scanning transmission electron microscopy.



3. Manuel Alonso-Orts, Rudolfo Hötzel, Tim Grieb, Matthias Auf der Maur, Maximilian Ries, Felix Nippert, Benjamin März, Knut Müller-Caspary, Markus R. Wagner, Andreas Rosenauer, and Martin Eickhoff. Correlative analysis on InGaN/GaN nanowires: structural and optical properties of self-assembled short-period superlattices. Discover Nano, 18(1):27, 2023.



4. Beeke Gerken, Christoph Mahr, Jakob Stahl, Tim Grieb, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Lutz Mädler, and Andreas Rosenauer. Material Discrimination in Nanoparticle Hetero-Aggregates by Analysis of Scanning Transmission Electron Microscopy Images. Particle & Particle Systems Characterization, 40(9):2300048, 2023. Keyword(s): double flame spray pyrolysis, energy-dispersive X-ray spectroscopy, hetero-aggregates, hetero-contact, nanoparticle mixing, scanning transmission electron microscopy.



5. Florian F. Krause, Marco Schowalter, Beeke Gerken, Dennis Marquardt, Tim Grieb, Thorsten Mehrtens, Christoph Mahr, and Andreas Rosenauer. Dose efficient annular bright field contrast with the ISTEM method: A proof of principle demonstration. Ultramicroscopy, 245:113661, 2023. Keyword(s): ISTEM, ABF STEM, Light atom imaging, Aperture manufacturing, Principle of reciprocity.



6. Cristian Messina, Yongkang Gong, Oumaima Abouzaid, Bogdan-Petrin Ratiu, Tim Grieb, Zhao Yan, Andreas Rosenauer, Sang Soon Oh, and Qiang Li. Deformed Honeycomb Lattices of InGaAs Nanowires Grown on Silicon-on-Insulator for Photonic Crystal Surface-Emitting Lasers. Advanced Optical Materials, 11(5):2201809, 2023. Keyword(s): III–V semiconductors, nanowires, photonic crystals, selective area epitaxy, surface-emitting lasers.



7. Maximilian Ries, Felix Nippert, Benjamin März, Manuel Alonso-Orts, Tim Grieb, Rudolfo Hötzel, Pascal Hille, Pouria Emtenani, Eser Metin Akinoglu, Eugen Speiser, Julian Plaickner, Jörg Schörmann, Matthias Auf der Maur, Knut Müller-Caspary, Andreas Rosenauer, Norbert Esser, Martin Eickhoff, and Markus R. Wagner. Origin of the spectral red-shift and polarization patterns of self-assembled InGaN nanostructures on GaN nanowires. Nanoscale, 15:7077-7085, 2023.



8. Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Jan-Philipp Ahl, Marco Schowalter, Oliver Oppermann, Joachim Hertkorn, Karl Engl, and Andreas Rosenauer. Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN. Ultramicroscopy, 238:113535, 2022. Keyword(s): GaN, InGaN, STEM, Quantitative, Angle-dependent scattering.



9. Christoph Mahr, Tim Grieb, Florian F. Krause, Marco Schowalter, and Andreas Rosenauer. Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential. Ultramicroscopy, 236:113503, 2022. Keyword(s): Mean inner potential, Nano-beam electron diffraction, Scanning transmission electron microscopy, Interface, Disc detection.



10. Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Saleh Firoozabadi, Christoph Mahr, Marco Schowalter, Andreas Beyer, Oliver Oppermann, Kerstin Volz, and Andreas Rosenauer. Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si. Ultramicroscopy, 221:113175, 2021. Keyword(s): Angle-resolved STEM, Quantitative STEM, Plasmon excitation, Inelastic scattering, Phonon correlation, Low-angle scattering.



11. Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Robert Ritz, Martin Simson, Jörg Schörmann, Christoph Mahr, Jan Müssener, Marco Schowalter, Heike Soltau, Martin Eickhoff, and Andreas Rosenauer. 4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection. Ultramicroscopy, 228:113321, 2021. Keyword(s): Electric fields, 4D STEM, Interfaces, COM, NBED.



12. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, and Andreas Rosenauer. Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods. Ultramicroscopy, 221:113196, 2021. Keyword(s): Strain measurement, Ptychography, Interface, 4D-STEM, Patterned apertures.



13. Dennis Marquardt, Marco Schowalter, Florian F. Krause, Tim Grieb, Christoph Mahr, Thorsten Mehrtens, and Andreas Rosenauer. Accuracy and precision of position determination in ISTEM imaging of BaTiO3. Ultramicroscopy, 227:113325, 2021. Keyword(s): Imaging scanning transmission electron microscopy, TEM, CTEM, STEM, Tunnel junctions, BaTiO, Atom position determination.



14. Andreas Beyer, Florian F Krause, Hoel L Robert, Saleh Firoozabadi, Tim Grieb, Pirmin Kükelhan, Damien Heimes, Marco Schowalter, Knut Müller-Caspary, Andreas Rosenauer, and Kerstin Volz. Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy. Scientific Reports, 10:1--15, 2020.



15. Christoph Mahr, Knut Müller-Caspary, Robert Ritz, Martin Simson, Tim Grieb, Marco Schowalter, Florian F. Krause, Anastasia Lackmann, Heike Soltau, Arne Wittstock, and Andreas Rosenauer. Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction. Ultramicroscopy, 196:74 - 82, 2019. Keyword(s): Strain measurement, Electron diffraction, Image distortions, 4D-STEM, Nanoporous gold.



16. Knut Müller-Caspary, Tim Grieb, Jan Müssener, Nicolas Gauquelin, Pascal Hille, Jörg Schörmann, Johan Verbeeck, Sandra Van Aert, Martin Eickhoff, and Andreas Rosenauer. Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy. Phys. Rev. Lett., 122:106102, March 2019.



17. Dipanwita Chatterjee, Shwetha Shetty, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, Andreas Rosenauer, and Narayanan Ravishankar. Ultrathin Au-Alloy Nanowires at the Liquid-Liquid Interface. Nano Lett., 18(3):1903--1907, March 2018.



18. Tim Grieb, Florian F. Krause, Marco Schowalter, Dennis Zillmann, Roman Sellin, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Dieter Bimberg, and Andreas Rosenauer. Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence. Ultramicroscopy, 190:45 - 57, 2018.



19. Tim Grieb, M. Tewes, Marco Schowalter, Knut Müller-Caspary, Florian F. Krause, Thorsten Mehrtens, and Andreas Rosenauer. Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation. Ultramicroscopy, 184:29-36, 2018. Keyword(s): NBED, Disc detection, Strain, Electric field measurement.



20. Christoph Mahr, Knut Müller-Caspary, Matthias Graf, Anastasia Lackmann, Tim Grieb, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Arne Wittstock, Jörg Weissmüller, and Andreas Rosenauer. Measurement of local crystal lattice strain variations in dealloyed nanoporous gold. Materials Research Letters, 6(1):84-92, 2018.



21. S. Schlichting, G. M. O. Hönig, J. Müßener, P. Hille, T. Grieb, S. Westerkamp, J. Teubert, J. Schörmann, M. R. Wagner, A. Rosenauer, M. Eickhoff, A. Hoffmann, and G. Callsen. Suppression of the quantum-confined Stark effect in polar nitride heterostructures. Communications Physics, 1(1):48, 2018.



22. C. Carmesin, M. Schowalter, M. Lorke, D. Mourad, T. Grieb, K. Müller-Caspary, M. Yacob, J. P. Reithmaier, M. Benyoucef, A. Rosenauer, and F. Jahnke. Interplay of morphology, composition, and optical properties of InP-based quantum dots emitting at the $1.55\phantom{\rule{0.28em}{0ex}}\ensuremath{\mu}\mathrm{m}$ telecom wavelength. Phys. Rev. B, 96:235309, December 2017.



23. N. Chery, T.H. Ngo, M.P. Chauvat, B. Damilano, A. Coruville, P. De Mierry, T. Grieb, T. Mehrtens, F.F. Krause, K. Meller-Caspary, M. Schowalter, B. Gil, A. Rosenauer, and P. Ruterana. The microstructure, local indium composition and photoluminescence in green-emitting InGaN/GaN quantum wells. Journal of Microscopy, 2017.



24. Tim Grieb, Florian F. Krause, Christoph Mahr, Dennis Zillmann, Knut Müller-Caspary, Marco Schowalter, and Andreas Rosenauer. Optimization of NBED simulations for disc-detection measurements. Ultramicroscopy, 181:50 - 60, 2017. Keyword(s): NBED, Disc detection, Strain, Electric field measurement.



25. Florian Meierhofer, Haipeng Li, Michael Gockeln, Robert Kun, Tim Grieb, Andreas Rosenauer, Udo Fritsching, Johannes Kiefer, Johannes Birkenstock, Lutz Mädler, and Suman Pokhrel. Screening Precursor-Solvent Combinations for Li$_4$Ti$_5$O$_{12}$ Energy Storage Material Using Flame Spray Pyrolysis. ACS Appl. Mater. Interfaces, 2017.



26. Knut Müller-Caspary, Florian F. Krause, Tim Grieb, Stefan Löffler, Marco Schowalter, Armand Béché, Vincent Galioit, Dennis Marquardt, Josef Zweck, Peter Schattschneider, Johan Verbeeck, and Andreas Rosenauer. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy. Ultramicroscopy, 178:62-80, 2017. Keyword(s): TEM.



27. Jan Müssener, Pascal Hille, Tim Grieb, Jörg Schörmann, Jörg Teubert, Eva Monroy, Andreas Rosenauer, and Martin Eickhoff. Bias-controlled optical transitions in GaN/AlN nanowire heterostructures. ACS Nano, 11:8758-8767, 2017.



28. Michael Teck, M. Mangir Murshed, Marco Schowalter, Niels Lefeld, Henrike K. Grossmann, Tim Grieb, Thomas Hartmann, Lars Robben, Andreas Rosenauer, Lutz Mädler, and Thorsten M. Gesing. Structural and spectroscopic comparison between polycrystalline, nanocrystalline and quantum dot visible light photo-catalyst Bi$_2$WO$_6$. Journal of Solid State Chemistry, 254:82-89, 2017.



29. Daniel Carvalho, Knut Müller-Caspary, Marco Schowalter, Tim Grieb, Thorsten Mehrtens, Andreas Rosenauer, Rafael Ben, Teresa Garcìa, Andrés Redondo-Cubero, Katharina Lorenz, Bruno Daudin, and Francisco M. Morales. Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction. Scientific Reports, 6:28459, June 2016. Keyword(s): DPC, strain, NBD, SANBED, nano-beam electron diffraction, polarization, polarisation, piezoelectric.



30. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Effects of instrument imperfections on quantitative scanning transmission electron microscopy. Ultramicroscopy, 161:146--160, 2016. Keyword(s): TEM.



31. K. Müller-Caspary, O. Oppermann, T. Grieb, F. F. Krause, A. Rosenauer, M. Schowalter, T. Mehrtens, A. Beyer, K. Volz, and P. Potapov. Materials characterisation by angle resolved scanning transmission electron microscopy. Scientific Reports, 6:37146, 2016.



32. Jochen A.H. Dreyer, Henrike K. Grossmann, Jinfan Chen, Tim Grieb, Bill B. Gong, Patrick H.-L. Sit, Lutz Mädler, and Wey Yang Teoh. Preferential oxidation of carbon monoxide over Pt-FeO$_{x}$/CeO$_{2}$ synthesized by two-nozzle flame spray pyrolysis. Journal of Catalysis, 329:248-261, 2015.



33. H.K. Grossmann, T. Grieb, F. Meierhofer, M.J. Hodapp, D. Noriler, A. Gröhn, H.F. Meier, U. Fritsching, K. Wegner, and L. Mädler. Nanoscale mixing during double-flame spray synthesis of heterostructured nanoparticles. J. Nanopart. Res., 17:174, 2015.



34. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Marco Schowalter, Thorsten Mehrtens, Florian. F. Krause, Dennis Zillmann, and Andreas Rosenauer. Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction. Ultramicroscopy, 158(0):38--48, 2015. Keyword(s): Strain measurement.



35. Tim Grieb, Knut Müller, Emmanuel Cadel, Andreas Beyer, Marco Schowalter, Etienne Talbot, Kerstin Volz, and Andreas Rosenauer. Simultaneous Quantification of Indium and Nitrogen Concentration in InGaNAs Using HAADF-STEM. Microscopy and Microanalysis, 20:1740, 9 2014.



36. H.K. Grossmann, T. Grieb, and S. Schopf, Y.H. Ng, R. Amal, and L. Mädler. Flame made oxide heterojunctions for photocatalytic water splitting. Chem. Ing. Tech., 86:1427, 2014.



37. R. R. Juluri, A. Rath, A. Ghosh, A. Bhukta, R. Sathyavathi, D. Narayana Rao, Knut Müller, Marco Schowalter, Kristian Frank, Tim Grieb, Florian Krause, Andreas Rosenauer, and Parlapalli Vencata Satyam. Coherently Embedded Ag Nanostructures in Si: 3D Imaging and their application to SERS. Scientific Reports, 4:4633, April 2014.



38. H. Kauko, B. O. Fimland, T. Grieb, A. M. Munshi, K. Müller, A. Rosenauer, and A. T. J. van Helvoort. Near-surface depletion of antimony during the growth of GaAsSb and GaAs/GaAsSb nanowires. Journal of Applied Physics, 116(14):144303, 2014.



39. H. Kauko, T. Grieb, A. M. Munshi, K. Mller, A. Rosenauer, B. O. Fimland, and A. T. J. van Helvoort. The Outward Diffusion of Sb during Nanowire Growth Studied by Quantitative High-Angle Annular Dark Field Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 20:186--187, 8 2014.



40. L. Mädler, A. Gröhn, T. Grieb, F. Meierhofer, U. Fritsching, K. Wegner, and H.K. Grossmann. Size -and composite-controlled synthesis of multi oxide nanoparticles using double-flame spray pyrolysis. Chem. Ing. Tech., 86:1541, 2014.



41. A. Rath, J. K. Dash, R. R. Juluri, A. Ghosh, T. Grieb, M. Schowalter, F. F. Krause, K. Müller, A. Rosenauer, and P. V. Satyam. A study of the initial stages of the growth of Au-assisted epitaxial Ge nanowires on a clean Ge(100) surface. CrystEngComm, 16:2486--2490, 2014.



42. Tobias Bollhorst, Tim Grieb, Andreas Rosenauer, Gerald Fuller, Michael Maas, and Kurosch Rezwan. Synthesis route for the self-assembly of submicrometer-sized colloidosomes with tailorable nanopores. Chem. Mater., 25:3464, 2013.



43. Tim Grieb, Knut Müller, Rafael Fritz, Vincenzo Grillo, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. Quantitative chemical evaluation of dilute GaNAs using ADF STEM: Avoiding surface strain induced artifacts. Ultramicroscopy, 129(0):1--9, 2013. Keyword(s): Quantitative.



44. H. Kauko, T. Grieb, R. Bjørge, M. Schowalter, A.M. Munshi, H. Weman, A. Rosenauer, and A.T.J. van Helvoort. Compositional characterization of GaAs/GaAsSb nanowires by quantitative HAADF-STEM. Micron, 44(0):254--260, 2013. Keyword(s): HAADF-STEM.



45. Julia Wehling, Eike Volkmann, Tim Grieb, Andreas Rosenauer, Michael Maas, Laura Treccani, and Kurosch Rezwan. A critical study: Assessment of the effect of silica particles from 15 to 500Â nm on bacterial viability. Environmental Pollution, 176(0):292--299, 2013. Keyword(s): Silica.



46. Tim Grieb, Knut Müller, Rafael Fritz, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. A method to avoid strain field induced artifacts in 2D chemical mapping of dilute GaNAs by HAADF STEM. Microsc. Microanal., 18(2):1028--1029, 2012.



47. Tim Grieb, Knut Müller, Oleg Rubel, Rafael Fritz, Claas Gloistein, Nils Neugebohrn, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. Determination of Nitrogen Concentration in Dilute GaNAs by STEM HAADF Z-Contrast Imaging and improved STEM-HAADF strain state analysis. Ultramicroscopy, 117:15--23, 2012.



48. Tim Grieb, Knut Müller, Oleg Rubel, Rafael Fritz, Claas Gloistein, Nils Neugebohrn, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. Determination of Nitrogen Concentration in Dilute GaNAs by STEM HAADF Z-Contrast Imaging. Journal of Physics: Conference Series, 326(1):012033, 2011.



49. V. Grillo, K. Müller, K. Volz, F. Glas, T. Grieb, and A. Rosenauer. Strain, composition and disorder in ADF imaging of semiconductors. Journal of Physics: Conference Series, 326(1):012006, 2011.

1. Tim Grieb, Christoph Mahr, Florian F. Krause, Knut Müller-Caspary, Marco Schowalter, Martin Eickhoff, and Andreas Rosenauer. Measuring electric fields with 4D-STEM: Demonstration of pitfalls by the example of GaN and SiGe. In European Microscopy Congress (EMC) 2024, Kopenhagen (Dänemark), [poster], 2024. Keyword(s): Konferenz.



2. Christoph Mahr, Florian F. Krause, Jakob Stahl, Beeke Gerken, Marco Schowalter, Tim Grieb, Lutz Mädler, and Andreas Rosenauer. Characterization of structure and mixing in nanoparticle hetero-aggregates using convolutional neural networks: 3D-reconstruction versus 2D-projection. In European Microscopy Congress (EMC) 2024, Kopenhagen (Dänemark), [talk], 2024. Keyword(s): Konferenz.



3. Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Christoph Mahr, Marco Schowalter, and Andreas Rosenauer. GaN atomic electric fields from STEM: Panther vs. EMPAD. In Microscopy Conference (MC) 2023, Darmstadt, [Poster IM6.P002], 2023.



4. Florian F. Krause, Tim Grieb, Christoph Mahr, Marco Schowalter, Thorsten Mehrtens, Rudolpho Hötzel, Stephan Figge, Martin Eickhoff, and Andreas Rosenauer. Electrical Fields in AlN/GaN-Nanowires Measured with Aberration-Corrected 4D-STEM. In Microscopy Conference (MC) 2023, Darmstadt, [Vortrag IM6.003], 2023.



5. Christoph Mahr, Tim Grieb, Florian F. Krause, Marco Schowalter, and Andreas Rosenauer. Can a difference in mean inner potential be measured from a shift of the central disc in nano-beam electron diffraction?. In Microscopy Conference (MC) 2023, Darmstadt, [Poster IM6.P001], 2023.



6. Marco Schowalter, Patrick Vogt, Justin Bich, Alexander Karg, Christoph Mahr, Tim Grieb, Florian F. Krause, Martin Eickhoff, and Andreas Rosenauer. Composition and strain of pseudomorphic $\alpha$-(AlGa)$_2$O$_3$ on sapphire (0001) substrates. In Microscopy Conference (MC) 2023, Darmstadt, [Poster MS3.P001], 2023.



7. Tim Grieb, Thorsten Mehrtens, Florian F. Krause, Christoph Mahr, Marco Schowalter, Dennis Marquardt, and Andreas Rosenauer. Composition Analysis of III/V Semiconductors by Quantitative Scanning Transmission Electron Microscopy. In DGKK/DEMBE 2022, Bremen, [talk], 2022. Keyword(s): Konferenz.



8. Florian F. Krause, Marco Schowalter, Tim Grieb, Christoph Mahr, and Andreas Rosenauer. tibaDESC: precise measurement of diffraction pattern distortions for quantitative STEM (Poster). In 19th International Microscopy Congress (IMC) 2018, Sydney (Australien) [Poster IT9.316], 2018.



9. Christoph Mahr, Knut Müller-Caspary, Martin Simson, Robert Ritz, Matthias Graf, Anastasia Lackmann, Tim Grieb, Marco Schowalter, Florian F Krause, Thorsten Mehrtens, Arne Wittstock, Heike Soltau, Jörg Weissmüller, and Andreas Rosenauer. Measurement of local crystal lattice strain variations in dealloyed nanoporous gold (Vortrag). In 19th International Microscopy Congress (IMC) 2018, Sydney (Australien) [Vortrag PS1.3.173], 2018.



10. N. Chery, N. T. Huong, M.P. Chauvat, B. Damilano, B. Gil, T. Grieb, M. Schowalter, A. Rosenauer, X. Portier, and P. Ruterana. Local structure and composition versus the optical properties of InGaN/GaN QWs for emission in and past the green gap. In MSM XX 2017, Oxford (GB), 2017.



11. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Effects of instrument imperfections on high resolution quantitative scanning transmission electron microscopy (Poster). In 4th Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO 2017), Vaalsbroek (NL), 2017.



12. Jan Mü�ener, Pascal Hille, Jörg Schörmann, Jörg Teubert, Bruno Gayral, Joel Bleuse, Eva Monroy, Tim Grieb, Andreas Rosenauer, and Martin Eickhoff. Bias-controlled optical transitions in GaN/AlN nanowire heterostructures. In Nanowire Week 2017, Lund (S), 2017.



13. M. Schowalter, C. Carmesin, M. Lorke, D. Mourad, T. Grieb, K. Müller-Caspary, M. Yacob, J. P. Reithmaier, M. Benyoucef, A. Rosenauer, and F. Jahnke. The influence of morphology of InAs/InAlGaAs quantum dots emitting in the low-loss telecom wavelength range. In MC 2017, Lausanne (CH), 2017.



14. Marco Schowalter, Beeke Geerken, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Annick De Backer, Sandra Van Aert, and Andreas Rosenauer. A comparison of the simulation based and statistics based atomic counting techniques (Poster). In 4th Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO 2017), Vaalsbroek (NL), 2017.



15. Marco Schowalter, Florian Fritz Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Influence of Microscope Imperfections and Detector Characteristics on Quantification of HAADF STEM images (Invited Talk). In 5th Annual Conference of AnalytiX (AnalytiX 2017), Fukuoka (J), 2017.



16. Tim Grieb, Florian F. Krause, Christoph Mahr, Knut Müller, and Andreas Rosenauer. Optimization of NBED simulations to predict experimental disc-detection measurements (Talk). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



17. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Measurement of Diffraction Pattern Distortions for Quantitative STEM (Poster). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



18. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, Anastasia Lackmann, Arne Wittstock, and Andreas Rosenauer. Measurement of strain in nanoporous gold using nano-beam electron diffraction. In European Microscopy Congress 2016 (EMC 2016), Lyon (F), [Poster IM06-352], 2016.



19. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Martial Duchamp, Tim Grieb, Marco Schowalter, Stefan Löffler, Oliver Oppermann, Vadim Migunov, Florian Winkler, Heike Soltau, Lothar Strüder, Josef Zweck, Peter Schattschneider, Rafal Dunin-Borkowski, Johan Verbeeck, and Andreas Rosenauer. Momentum-resolved STEM: Measurement of atomic electric fields and angular multi-range analysis [Invited talk]. In The XXXVII Annual Meeting of the Electron Microscopy Society of India - International Conference on Electron Microscopy, 2016. Keyword(s): DPC, iris, picodiffraction, electric fields, ARSTEM.



20. Knut Müller-Caspary, Thorsten Mehrtens, Marco Schowalter, Tim Grieb, Andreas Rosenauer, Florian F. Krause, Christoph Mahr, and Pavel Potapov. ImageEval. A software for the processing, evaluation and acquisition of (S)TEM images. In European Microscopy Congress 2016, Lyon (F), [Poster IM03-286], 2016.



21. K. Müller-Caspary, O. Oppermann, T. Grieb, A. Rosenauer, F. F. Krause, M. Schowalter, T. Mehrtens, P. Potapov, A. Beyer, and K. Volz. Angle-resolved scanning transmission electron microscopy employing an iris aperture (Poster). In Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham (UK), 2016.



22. Knut Müller-Caspary, Oliver Oppermann, Tim Grieb, Andreas Rosenauer, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Pavel Potapov, Andreas Beyer, and Kerstin Volz. Angle-resolved Scanning Transmission Electron Microscopy (ARSTEM) for materials analysis. In European Microscopy Congress 2016, Lyon (F), [Poster IM06-350], 2016.



23. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, and T. Mehrtens. Analysis of composition and strain in semiconductor nanostructures by quantitative HAADF-STEM and imaging STEM. In PCSI 2016, Santa Barbara (US), 2016.



24. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, T. Mehrtens, A. Beche, J. Verbeeck, V. Galioit, J. Zweck, Stefan Löffler, and Peter Schattschneider. Quantitative STEM - From composition to atomic electric fields (Invited Talk). In Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham (UK), 2016.



25. Andreas Rosenauer, Knut Müller-Caspary, Marco Schowalter, Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Armand Beche, Johan Verbeeck, Josef Zweck, Stefan Löffler, Peter Schattschneider, Marcus Müller, Peter Veit, Sebastian Metzner, Frank Bertram, Tilman Schimpke, Martin Strassburg, and Rafal Dunin-Borkowski. Quantitative STEM -- From composition to atomic electric fields [Invited Talk]. In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



26. Marco Schowalter, Beeke Geerken, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Andreas Rosenauer, and Sandra Van Aert. Atom-counting in a non-probe corrected STEM (Poster). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



27. M. Schowalter, F. F. Krause, T. Grieb, K. Müller-Caspary, T. Mehrtens, and A. Rosenauer. Effects of instrument imperfections on quantitative scanning transmission electron Microscopy (Poster). In Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham (UK), 2016.



28. M. Schowalter, F. F. Krause, T. Grieb, K. Müller-Caspary, and T. Mehrtens A. Rosenauer. Effects of instrument imperfections on quantitative scanning transission electron microscopy. In PCSI 2016, Santa Barbara (US), 2016.



29. Tim Grieb, Daniel Carvalho, Knut Müller-Caspary, Marco Schowalter, Christoph Mahr, Andreas Beyer, Andreas Hyra, T. Ben, F. M. Morales, R. Garcia, Kerstin Volz, B. Daudin, and Andreas Rosenauer. Quantitative nano-beam electron diffraction: Measuring strain and electric fields. In Microscopy Conference MC 2015, Göttingen (D), Session IM 2 [Talk], September 6-11th 2015.



30. H.K. Grossmann, S. Schopf, T. Grieb, W. Li, A. Kuc, T. Heini, and L. Mädler. Flame made mixed metal oxide catalyst systems for the photo induced water splitting process. In Solar Fuels 2015, Uppsala (SE), 2015.



31. Christoph Mahr, Knut Müller, Marco Schowalter, Thorsten Mehrtens, Tim Grieb, Florian F. Krause, Daniel Erben, and Andreas Rosenauer. Analysis and improvement of precision and accuracy of strain measurements by convergent nano-beam electron diffraction (SANBED). In Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK) [Talk], volume Session 3b, Tue, March 31st, 2015.



32. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Thorsten Mehrtens, Marco Schowalter, Florian F. Krause, Dennis Zillmann, and Andreas Rosenauer. Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction (SANBED). In Microscopy Conference MC 2015, Göttingen (D), session MS 2, [Poster MS2.P023], September 6-11th 2015.



33. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Oliver Oppermann, Tim Grieb, Andreas Oelsner, Pavel Potapov, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields. In Frontiers of Electron Microscopy in Materials Science (FEMMS) 2015, Lake Tahoe (CA/USA), [Invited Talk], September 13-18th 2015.



34. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, and T. Mehrtens. Analysis of composition and strain in semiconductor nanostructures by quantitative STEM using HAADF intensity, angular multi-range analysis and imaging STEM. In Microscopy Conference MC 2015, Göttingen (D), Session MS 2 [Invited Talk], September 6-11th 2015.



35. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F.F. Krause, T. Mehrtens, A. Béché, J. Verbeeck, V. Galioit, J. Zweck, Stefan Löffler, and Peter Schattschneider. Quantitative STEM. In Proceedings of the International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices 2015 (IAMNANO 2015) [Invited Talk], Hamburg (D), 2015.



36. Marco Schowalter, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Effects of Instrument Imperfections on Quantitative Scanning Transmission Electron Microscopy (Poster. In Proceedings of the Microscopy Conference 2015 (MC 2015), Göttingen (D), September 6-11th 2015.



37. Marco Schowalter, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Investigation of detector characteristics for quantification of HAADF-STEM images (Poster). In Proceedings of Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK), 2015.



38. M. Schowalter, A. Rosenauer, K. Müller-Caspary, T. Grieb, and T. Mehrtens. Quantitative STEM. In EAgLE workshop on high-resolution transmission electron microscopy - from sample preparation to interpretation, 21.-25. September 2015, Warsaw, Poland (invited talk), 2015.



39. M. C. Sequeira, M. B. Lourenco, A. Redondo-Cubero, N. Franco, E. Alves, M. Sousa, T. C. Esteves, J. Rodrigues, N. Ben Sedrine, M. J. Soares, A. J. Neves, M. R. Correia, T. Monteiro, P. R. Edwards, K. P. O'Donnell, M. Bockowski, C. Wetzel, D. Carvalho, T. Ben, F.M. Morales, R. Garcia, T. Grieb, A. Rosenauer, P. Kluth, and K. Lorenz. Quantum Well Intermixing in InGaN/GaN Structures. In ICDS 2015, Espoo (FI), 2015.



40. M. Teck, H. K. Grossmann, T. Grieb, T. Hartmann, L. M�dler, and Th. M Gesing. PDF-refinement of crystalline & nanocrystalline Bi2WO6. In DGK 2015, G�ttingen (DE), 2015.



41. T Grieb, Müller K., Mahr C., Cadel E., Beyer A., Talbot E., Schowalter M., Volz K., and Rosenauer A.. A Method to Analyse the Chemical Composition in (InGa)(NAs) based on Evaluation of HAADF Intensity in STEM. In 18th International Microscopy Congress (IMC) [Talk IT-2-O-2414], 2014.



42. H.K. Grossmann, T. Grieb, and L. Mädler. Tailor made multi-component oxide nanaoparticles produced by double flame spray pyrolysis and their application for photocatalytic water splitting. In ICONN 2014, Adelaine (AU), 2014.



43. H.K. Grossmann, T. Grieb, and S. Schopf, Y.H. Ng, R. Amal, and L. Mädler. Flame made oxide heterojunctions for efficient charge separation in photocatalytic applications. In IPS conference 2014, Berlin (DE), 2014.



44. H.K. Grossmann, T. Grieb, and S. Schopf, Y.H. Ng, R. Amal, and L. Mädler. Flame made oxide heterojunctions for photocatalytic water splitting. In ProcessNet Jahrestagung (2014), Aachen (DE), 2014.



45. H.K. Grossmann, A. Gröhn, T. Grieb, F. Meierhofer, U. Fritsching, K. Wegner, and L. Mädler. Size and composite controlled synthesis of multi oxide nanoparticles using double flame spray pyrolysis. In ProcessNet Jahrestagung (2014), Aachen (DE), 2014.



46. H. Kauko, T. Grieb, A. M. Munshi, K. Mller, A. Rosenauer, B. O. Fimland, and A. T. J. van Helvoort. The Outward Diffusion of Sb during Nanowire Growth Studied by Quantitative High-Angle Annular Dark Field Scanning Transmission Electron Microscopy. In Nanowires 2014, Eindhoven (NL), volume 20, pages 186--187, 8 2014.



47. M.B. Lourenco, A. Redondo-Cubero, N. Franco, E. Alves, M. Sousa, T.C. Esteves, J. Rodrigues, N. Ben Sedrine, M.J. Soares, A.J. Neves, M.R. Correia, T. Monteiro, P.R. Edwards, K.P. O'Donnell, M. Bockowski, C. Wetzel, D. Carvalho, T. Ben, F.M. Morales, R. Garcia, T. Grieb, A. Rosenauer, and K. Lorenz. High thermal stability of InGaN/GaN quantum wells. In Vacuum conference (2014), Aveiro (PT), 2014.



48. M. Schowalter, F. Krause, T. Grieb, T. Mehrtens, K. Müller, and A. Rosenauer. Position resolved single electron response of the HAADF-STEM detector and improved method for intensity normalisation. In 18th International Microscopy Congress (IMC) [Talk IT-2-O-3292], 2014.



49. Tim Grieb, Knut Müller, Emanuel Cadel, Rafael Fritz, Nils Neugebohrn, Etienne Talbot, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. Chemical composition analysis of dilute GaNAs and InGaNAs by high-angle annular dark field STEM. In International Conference on Electron Microscopy and XXIV Annual Meeting of the Electron Microscope Society of India (EMSI) 2013, Kolkata (India) [Talk], 2013.



50. T. Grieb, K. Müller, E. Cadel, R. Fritz, E. Talbot, M. Schowalter, K. Volz, and A. Rosenauer. Determination of In and N concentration in (InGa)(NAs) quantum wells using HAADF STEM and investigation of annealing effects. In Proceedings of the Microscopy Conference 2013 (MC 2013, Regensburg) Germany [Poster], volume 1: Instrumentation and Methods, pages IM.1.P024, 2013.



51. T. Grieb, K. Müller, R. Fritz, V. Grillo, M. Schowalter, K. Volz, and A. Rosenauer. Avoiding surface strain field induced artifacts in 2d chemical mapping of dilute GaNAs quantum wells by HAADF STEM. In Proceedings of the Microscopy Conference 2013 (MC 2013, Regensburg) Germany [Poster], volume 1: Instrumentation and Methods, pages IM.1.P008, 2013.



52. Tim Grieb, Knut Müller, Rafael Fritz, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. A method to avoid strain field induced artifacts in 2D chemical mapping of dilute GaNAs by HAADF STEM. In Microscopy and Microanalysis [Talk 595], volume 18, pages 1028--1029, 2012.



53. Tim Grieb, Knut Müller, Rafael Fritz, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. A new method for true 2d chemical mapping: strain-field unaffected evaluation of dilute GaNAs by HAADF STEM. In Microscopy and Microanalysis (M&M) conference 2012, Phoenix (USA) [Poster], 2012.



54. Tim Grieb, Knut Müller, Andreas Hyra, Rafael Fritz, Marco Schowalter, Nicolai Knaub, and Andreas Rosenauer. Chemical analysis of InGaNAs quantum wells using HAADF STEM. In EMC 2012 [Poster], Session PS1.2: Thin films, Coatings and Interface, Manchester (UK), 2012.



55. H. Kauko, T. Grieb, A. Rosenauer, and A. T. J. van Helvoort. Studying Sb distribution in heterostructured GaAs/GaAsSb nanowires with quantitative HAADF-STEM. In EMC 2012, Manchester (UK), 2012.



56. R. Fritz, A. Beyer, W. Stolz, O. Rubel, T. Grieb, K. Müller, M. Schowalter, A. Rosenauer, I. Häusler, A. Mogilatenko, H. Kirmse, W. Neumann, and K. Volz. HAADF-STEM in a JEOL 2200FS for quantitative analysis of composition in compound III/V semiconductor materials. In W. Jäger, W. Kaysser, W. Benecke, W. Depmeier, S. Gorb, L. Kienle, M. Mulisch, D. Häussler, and A. Lotnyk, editors, Proceedings of the Microscopy Conference 2011 (MC 2011, Kiel), volume 1: Instrumentation and Methods, pages IM2.P130, 2011. DGE - German Society for Electron Microscopy.



57. T. Grieb, K. Müller, O. Rubel, R. Fritz, C. Gloistein, N. Neugebohrn, M. Schowalter, K. Volz, and A. Rosenauer. Determination of Nitrogen concentration in dilute GaNAs by STEM HAADF Z-contrast imaging. In MSM 2011 Cambridge, U.K. [talk] talk D13, 2011.



58. Tim Grieb, Knut Müller, Oleg Rubel, Rafael Fritz, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. Determination of nitrogen concentration in dilute GaNAs by STEM HAADF Z-contrast imaging. In DPG Frühjahrstagung, Dresden (Germany) [Talk], 2011.



59. T. Grieb, K. Müller, O. Rubel, R. Fritz, M. Schowalter, K. Volz, and A. Rosenauer. STEM strain state analysis in combination with HAADF intensity evaluation to determine chemical composition of GaNAs quantum wells. In W. Jäger, W. Kaysser, W. Benecke, W. Depmeier, S. Gorb, L. Kienle, M. Mulisch, D. Häussler, and A. Lotnyk, editors, Proceedings of the Microscopy Conference 2011 (MC 2011, Kiel), volume 1: Instrumentation and Methods, pages IM2.P120, 2011. DGE - German Society for Electron Microscopy.



60. H. Kauko, T. Grieb, A. Rosenauer, R. Bjørge, M. Munshi, H. Weman, and A. T. J. van Helvoort. Composition analysis of heterostructured GaAs nanowires with quantitative HAADF-STEM. In Nanolab Meeting 2011, Trondheim (NO),, 2011.



61. K. Müller, T. Grieb, O. Rubel, M. Schowalter, R. Fritz, D. Z. Hu, D. Schaadt, M. Hetterich, K. Volz, and A. Rosenauer. Conventional and Scanning TEM of InGaNAs: Comparison of theory and experiment. In W. Jäger, W. Kaysser, W. Benecke, W. Depmeier, S. Gorb, L. Kienle, M. Mulisch, D. Häussler, and A. Lotnyk, editors, Proceedings of the Microscopy Conference 2011 (MC 2011, Kiel) Germany [poster] Best poster award, volume 1: Instrumentation and Methods, pages IM2.P132, 2011. DGE - German Society for Electron Microscopy.



62. P. V. Satyam, A. Rosenauer, J. Dash, A. Rath, J. Raghava, M. Schowalter, Tim Grieb, K. M�ller, T. Mehrtens, and Robert Imlau. Compositional analysis of nanostructures with STEM Z-contrast imaging. In EM50, Hyderabad (India) [Talk], 2011.

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