1. Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Christoph Mahr, Beeke Gerken, Marco Schowalter, Bert Freitag, and Andreas Rosenauer. GaN atomic electric fields from a segmented STEM detector: Experiment and simulation. Journal of Microscopy, n/a(n/a), 2024. Keyword(s): 4D STEM, centre-of-mass, COM, electric fields, GaN, momentum-resolved STEM, segmented STEM detector.



2. Christoph Mahr, Jakob Stahl, Beeke Gerken, Valentin Baric, Max Frei, Florian F. Krause, Tim Grieb, Marco Schowalter, Thorsten Mehrtens, Einar Kruis, Lutz Mädler, and Andreas Rosenauer. Characterization of mixing in nanoparticle hetero-aggregates by convolutional neural networks. Nano Select, 5(4):2300128, 2024. Keyword(s): convolutional neural networks, double flame spray pyrolysis, hetero-aggregate, nanoparticle mixing, scanning transmission electron microscopy.



3. Beeke Gerken, Christoph Mahr, Jakob Stahl, Tim Grieb, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Lutz Mädler, and Andreas Rosenauer. Material Discrimination in Nanoparticle Hetero-Aggregates by Analysis of Scanning Transmission Electron Microscopy Images. Particle & Particle Systems Characterization, 40(9):2300048, 2023. Keyword(s): double flame spray pyrolysis, energy-dispersive X-ray spectroscopy, hetero-aggregates, hetero-contact, nanoparticle mixing, scanning transmission electron microscopy.



4. Florian F. Krause, Marco Schowalter, Beeke Gerken, Dennis Marquardt, Tim Grieb, Thorsten Mehrtens, Christoph Mahr, and Andreas Rosenauer. Dose efficient annular bright field contrast with the ISTEM method: A proof of principle demonstration. Ultramicroscopy, 245:113661, 2023. Keyword(s): ISTEM, ABF STEM, Light atom imaging, Aperture manufacturing, Principle of reciprocity.



5. Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Jan-Philipp Ahl, Marco Schowalter, Oliver Oppermann, Joachim Hertkorn, Karl Engl, and Andreas Rosenauer. Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN. Ultramicroscopy, 238:113535, 2022. Keyword(s): GaN, InGaN, STEM, Quantitative, Angle-dependent scattering.



6. Christoph Mahr, Tim Grieb, Florian F. Krause, Marco Schowalter, and Andreas Rosenauer. Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential. Ultramicroscopy, 236:113503, 2022. Keyword(s): Mean inner potential, Nano-beam electron diffraction, Scanning transmission electron microscopy, Interface, Disc detection.



7. Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Saleh Firoozabadi, Christoph Mahr, Marco Schowalter, Andreas Beyer, Oliver Oppermann, Kerstin Volz, and Andreas Rosenauer. Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si. Ultramicroscopy, 221:113175, 2021. Keyword(s): Angle-resolved STEM, Quantitative STEM, Plasmon excitation, Inelastic scattering, Phonon correlation, Low-angle scattering.



8. Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Robert Ritz, Martin Simson, Jörg Schörmann, Christoph Mahr, Jan Müssener, Marco Schowalter, Heike Soltau, Martin Eickhoff, and Andreas Rosenauer. 4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection. Ultramicroscopy, 228:113321, 2021. Keyword(s): Electric fields, 4D STEM, Interfaces, COM, NBED.



9. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, and Andreas Rosenauer. Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods. Ultramicroscopy, 221:113196, 2021. Keyword(s): Strain measurement, Ptychography, Interface, 4D-STEM, Patterned apertures.



10. Dennis Marquardt, Marco Schowalter, Florian F. Krause, Tim Grieb, Christoph Mahr, Thorsten Mehrtens, and Andreas Rosenauer. Accuracy and precision of position determination in ISTEM imaging of BaTiO3. Ultramicroscopy, 227:113325, 2021. Keyword(s): Imaging scanning transmission electron microscopy, TEM, CTEM, STEM, Tunnel junctions, BaTiO, Atom position determination.



11. Andreas Beyer, Florian F Krause, Hoel L Robert, Saleh Firoozabadi, Tim Grieb, Pirmin Kükelhan, Damien Heimes, Marco Schowalter, Knut Müller-Caspary, Andreas Rosenauer, and Kerstin Volz. Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy. Scientific Reports, 10:1--15, 2020.



12. Christoph Mahr, Knut Müller-Caspary, Robert Ritz, Martin Simson, Tim Grieb, Marco Schowalter, Florian F. Krause, Anastasia Lackmann, Heike Soltau, Arne Wittstock, and Andreas Rosenauer. Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction. Ultramicroscopy, 196:74 - 82, 2019. Keyword(s): Strain measurement, Electron diffraction, Image distortions, 4D-STEM, Nanoporous gold.



13. Dipanwita Chatterjee, Shwetha Shetty, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, Andreas Rosenauer, and Narayanan Ravishankar. Ultrathin Au-Alloy Nanowires at the Liquid-Liquid Interface. Nano Lett., 18(3):1903--1907, March 2018.



14. Tim Grieb, Florian F. Krause, Marco Schowalter, Dennis Zillmann, Roman Sellin, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Dieter Bimberg, and Andreas Rosenauer. Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence. Ultramicroscopy, 190:45 - 57, 2018.



15. Tim Grieb, M. Tewes, Marco Schowalter, Knut Müller-Caspary, Florian F. Krause, Thorsten Mehrtens, and Andreas Rosenauer. Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation. Ultramicroscopy, 184:29-36, 2018. Keyword(s): NBED, Disc detection, Strain, Electric field measurement.



16. Christoph Mahr, Knut Müller-Caspary, Matthias Graf, Anastasia Lackmann, Tim Grieb, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Arne Wittstock, Jörg Weissmüller, and Andreas Rosenauer. Measurement of local crystal lattice strain variations in dealloyed nanoporous gold. Materials Research Letters, 6(1):84-92, 2018.



17. M. Alania, A. De Backer, I. Lobato, F.F. Krause, D. Van Dyck, A. Rosenauer, and S. Van Aert. How precise can atoms of a nanocluster be located in 3D using a tilt series of scanning transmission electron microscopy images?. Ultramicroscopy, 181:134 - 143, 2017. Keyword(s): Electron tomography, High-resolution electron microscopy, Precision, Resolution, Cramér-Rao lower bound.



18. N. Chery, T.H. Ngo, M.P. Chauvat, B. Damilano, A. Coruville, P. De Mierry, T. Grieb, T. Mehrtens, F.F. Krause, K. Meller-Caspary, M. Schowalter, B. Gil, A. Rosenauer, and P. Ruterana. The microstructure, local indium composition and photoluminescence in green-emitting InGaN/GaN quantum wells. Journal of Microscopy, 2017.



19. N. Gauquelin, K.H.W. van den Bos, A. Beche, F.F. Krause, I. Lobato, S. Lazar, A. Rosenauer, S. Van Aert, and J. Verbeeck. Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques. Ultramicroscopy, 181:178-190, 2017. Note: Cited By 0.



20. Tim Grieb, Florian F. Krause, Christoph Mahr, Dennis Zillmann, Knut Müller-Caspary, Marco Schowalter, and Andreas Rosenauer. Optimization of NBED simulations for disc-detection measurements. Ultramicroscopy, 181:50 - 60, 2017. Keyword(s): NBED, Disc detection, Strain, Electric field measurement.



21. Florian F. Krause and A. Rosenauer. Reciprocity Relations in Transmission Electron Microscopy: A Rigorous Deviation. Micron, 92:1--5, 2017. Keyword(s): notacc.



22. F.F. Krause, A. Rosenauer, J. Barthel, J. Mayer, K. Urban, R.E. Dunin-Borkowski, H.G. Brown, B.D. Forbes, and L.J. Allen. Atomic resolution elemental mapping using energy-filtered imaging scanning transmission electron microscopy with chromatic aberration correction. Ultramicroscopy, 181:173 - 177, 2017. Keyword(s): Atomic resolution imaging, Elemental mapping, Energy-filtered imaging scanning transmission electron microscopy.



23. Florian F. Krause, Andreas Rosenauer, and Dirk Van Dyck. Imaging theory for the ISTEM imaging mode. Ultramicroscopy, 181:107 - 116, 2017. Keyword(s): ISTEM, Imaging STEM, Incoherent imaging, Image formation, Resolution, Scherzer conditions.



24. Knut Müller-Caspary, Florian F. Krause, Tim Grieb, Stefan Löffler, Marco Schowalter, Armand Béché, Vincent Galioit, Dennis Marquardt, Josef Zweck, Peter Schattschneider, Johan Verbeeck, and Andreas Rosenauer. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy. Ultramicroscopy, 178:62-80, 2017. Keyword(s): TEM.



25. K. W. H. van den Bos, Florian F. Krause, Armand Beche, Johan Verbeeck, Andreas Rosenauer, and Sandra Van Aert. Locating light and heavy atomic column positions with picometer precision using ISTEM. Ultramicroscopy, 172:75--81, 2017.



26. Florian. F. Krause. Stemming Unwanted Interference: Resolution Improvement by Incoherent Imaging with ISTEM. Imaging & Microscopy, 18(2):40--43, 2016. Keyword(s): notpeer.



27. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Effects of instrument imperfections on quantitative scanning transmission electron microscopy. Ultramicroscopy, 161:146--160, 2016. Keyword(s): TEM.



28. K. Müller-Caspary, O. Oppermann, T. Grieb, F. F. Krause, A. Rosenauer, M. Schowalter, T. Mehrtens, A. Beyer, K. Volz, and P. Potapov. Materials characterisation by angle resolved scanning transmission electron microscopy. Scientific Reports, 6:37146, 2016.



29. Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F. Krause, Andreas Rosenauer, and van Aken Peter. Sample tilt effects on atom column position determination in ABF-STEM imaging. Ultramicroscopy, 160:110--117, 2016. Keyword(s): Annular bright-field imaging.



30. Florian F. Krause, Jan-Philipp Ahl, Darius Tytko, Pyuck-Pa Choi, Ricardo Egoavil, Marco Schowalter, Thorsten Mehrtens, Knut Müller-Caspary, Johan Verbeeck, Dierk Raabe, Joachim Hertkorn, Karl Engl, and Andreas Rosenauer. Homogeneity and composition of AlInGaN: A multiprobe nanostructure study. Ultramicroscopy, 156(0):29--36, 2015. Keyword(s): HAADF STEM.



31. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Marco Schowalter, Thorsten Mehrtens, Florian. F. Krause, Dennis Zillmann, and Andreas Rosenauer. Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction. Ultramicroscopy, 158(0):38--48, 2015. Keyword(s): Strain measurement.



32. Elias Goldmann, Matthias Paul, Florian F. Krause, Knut Müller, Jan Kettler, Thorsten Mehrtens, Andreas Rosenauer, Michael Jetter, Peter Michler, and Frank Jahnke. Structural and emission properties of InGaAs/GaAs quantum dots emitting at 1.3 micrometers. Applied Physics Letters, 105(15):152102, 2014.



33. R. R. Juluri, A. Rath, A. Ghosh, A. Bhukta, R. Sathyavathi, D. Narayana Rao, Knut Müller, Marco Schowalter, Kristian Frank, Tim Grieb, Florian Krause, Andreas Rosenauer, and Parlapalli Vencata Satyam. Coherently Embedded Ag Nanostructures in Si: 3D Imaging and their application to SERS. Scientific Reports, 4:4633, April 2014.



34. Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction. Nature Communications, 5:5653:1--8, December 2014. Keyword(s): DPC, STEM, electric field.



35. A. Rath, J. K. Dash, R. R. Juluri, A. Ghosh, T. Grieb, M. Schowalter, F. F. Krause, K. Müller, A. Rosenauer, and P. V. Satyam. A study of the initial stages of the growth of Au-assisted epitaxial Ge nanowires on a clean Ge(100) surface. CrystEngComm, 16:2486--2490, 2014.



36. Andreas Rosenauer, Florian F. Krause, Knut Müller, Marco Schowalter, and Thorsten Mehrtens. Conventional Transmission Electron Microscopy Imaging beyond the Diffraction and Information Limits. Phys. Rev. Lett., 113:096101, August 2014.



37. Marco Schowalter, Ingo Stoffers, Florian F. Krause, Thorsten Mehrtens, Knut Müller, Malte Fandrich, Timo Aschenbrenner, Detlef Hommel, and Andreas Rosenauer. Influence of Static Atomic Displacements on Composition Quantification of AlGaN/GaN Heterostructures from HAADF-STEM Images. Microscopy and Microanalysis, 20:1463--1470, 10 2014.



38. Florian F. Krause, Knut Müller, Dennis Zillmann, Jacob Jansen, Marco Schowalter, and Andreas Rosenauer. Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods. Ultramicroscopy, 134(0):94--101, 2013. Keyword(s): Stobbs factor.



39. M Tewes, F F Krause, K Müller, P Potapov, M Schowalter, T Mehrtens, and A Rosenauer. Quantitative Composition Evaluation from HAADF-STEM in GeSi/Si Heterostructures. Journal of Physics: Conference Series, 471(1):012011, 2013.

1. Tim Grieb, Christoph Mahr, Florian F. Krause, Knut Müller-Caspary, Marco Schowalter, Martin Eickhoff, and Andreas Rosenauer. Measuring electric fields with 4D-STEM: Demonstration of pitfalls by the example of GaN and SiGe. In European Microscopy Congress (EMC) 2024, Kopenhagen (Dänemark), [poster], 2024. Keyword(s): Konferenz.



2. Christoph Mahr, Florian F. Krause, Jakob Stahl, Beeke Gerken, Marco Schowalter, Tim Grieb, Lutz Mädler, and Andreas Rosenauer. Characterization of structure and mixing in nanoparticle hetero-aggregates using convolutional neural networks: 3D-reconstruction versus 2D-projection. In European Microscopy Congress (EMC) 2024, Kopenhagen (Dänemark), [talk], 2024. Keyword(s): Konferenz.



3. Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Christoph Mahr, Marco Schowalter, and Andreas Rosenauer. GaN atomic electric fields from STEM: Panther vs. EMPAD. In Microscopy Conference (MC) 2023, Darmstadt, [Poster IM6.P002], 2023.



4. Florian F. Krause, Tim Grieb, Christoph Mahr, Marco Schowalter, Thorsten Mehrtens, Rudolpho Hötzel, Stephan Figge, Martin Eickhoff, and Andreas Rosenauer. Electrical Fields in AlN/GaN-Nanowires Measured with Aberration-Corrected 4D-STEM. In Microscopy Conference (MC) 2023, Darmstadt, [Vortrag IM6.003], 2023.



5. Florian F. Krause, Christoph Mahr, Marco Schowalter, and Andreas Rosenauer. An adaptive scanning scheme for dose efficient acquisition of EDX-maps. In International Microscopy Congress (IMC20) 2023, Busan (Südkorea), [poster AS-08.P.0625], 2023.



6. Christoph Mahr, Tim Grieb, Florian F. Krause, Marco Schowalter, and Andreas Rosenauer. Can a difference in mean inner potential be measured from a shift of the central disc in nano-beam electron diffraction?. In Microscopy Conference (MC) 2023, Darmstadt, [Poster IM6.P001], 2023.



7. Marco Schowalter, Patrick Vogt, Justin Bich, Alexander Karg, Christoph Mahr, Tim Grieb, Florian F. Krause, Martin Eickhoff, and Andreas Rosenauer. Composition and strain of pseudomorphic $\alpha$-(AlGa)$_2$O$_3$ on sapphire (0001) substrates. In Microscopy Conference (MC) 2023, Darmstadt, [Poster MS3.P001], 2023.



8. Tim Grieb, Thorsten Mehrtens, Florian F. Krause, Christoph Mahr, Marco Schowalter, Dennis Marquardt, and Andreas Rosenauer. Composition Analysis of III/V Semiconductors by Quantitative Scanning Transmission Electron Microscopy. In DGKK/DEMBE 2022, Bremen, [talk], 2022. Keyword(s): Konferenz.



9. Florian F. Krause, Christoph Mahr, Marco Schowalter, Beeke Gerken, Thorsten Mehrtens, Andreas Rosenauer, Dirk van Dyck, Hamish G. Brown, Benjamin D. Forbes, Leslie J. Allen, Juri and Barthel, Joachim Meyer, Knut Urban, and Rafal Dunin-Borkowski. ISTEM: strongly incoherent imaging for ultra-high resolution TEM (Vortrag). In 19th International Microscopy Congress (IMC) 2018, Sydney (Australien) [Vortrag IT9.2.357], 2018.



10. Florian F. Krause, Marco Schowalter, Tim Grieb, Christoph Mahr, and Andreas Rosenauer. tibaDESC: precise measurement of diffraction pattern distortions for quantitative STEM (Poster). In 19th International Microscopy Congress (IMC) 2018, Sydney (Australien) [Poster IT9.316], 2018.



11. Christoph Mahr, Knut Müller-Caspary, Martin Simson, Robert Ritz, Matthias Graf, Anastasia Lackmann, Tim Grieb, Marco Schowalter, Florian F Krause, Thorsten Mehrtens, Arne Wittstock, Heike Soltau, Jörg Weissmüller, and Andreas Rosenauer. Measurement of local crystal lattice strain variations in dealloyed nanoporous gold (Vortrag). In 19th International Microscopy Congress (IMC) 2018, Sydney (Australien) [Vortrag PS1.3.173], 2018.



12. N. Gauquelin, K.H.W. van den Bos, A. Beche, F.F. Krause, I. Lobato, S. Lazar, A. Rosenauer, S. Van Aert, and J. Verbeeck. Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques. In Microscopy Conference 2017 (MC 2017), Lausanne (CH), 2017.



13. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Effects of instrument imperfections on high resolution quantitative scanning transmission electron microscopy (Poster). In 4th Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO 2017), Vaalsbroek (NL), 2017.



14. Florian F Krause, Marco Schowalter, Marcus Müller, Jan-Philipp Ahl, Tilman Schimpke, Sebastian Metzner, Joachim Hertkorn, Frank Bertram, Thorsten Mehrtens, Peter Veit, Karl Engl, Martin Strassburg, Jürgen Christen, and Andreas Rosenauer. Structural and copositional multiprobe investigations of AlInGaN semiconductor structures and core-shell nanorod LEDs (Invited Talk). In Society of Photo-Optical Instrumentation Engineers Photonics West 2017 (SPIE Photonics West 2017) , San Francisco (USA), 2017.



15. M. Müller, S. Metzner, T. Hempel, P. Veit, F. Bertram, F F Krause, T Mehrtens, K. Müller-Caspary, A Rosenauer, T. Schimpke, A. Avramescu, M. Strassburg, and J. Christen. Accessing optical and compositional properties of InGaN/GaN core-shell nanorods at the nanometer scale (Talk). In 9th International Conference on Materials for Advanced Technologies (ICMAT 2017) , Singapur (Singapur), 2017.



16. M. Müller, S. Metzner, T. Hempel, P. Veit, F. Bertram, F F Krause, T Mehrtens, K. Müller-Caspary, A Rosenauer, T. Schimpke, A. Avramescu, M. Strassburg, and J. Christen. Nano-scale correlation of the optical, structural, and compositional properties of InGaN/GaN core-shell nanorod LEDs (Talk). In 5th International Conference on Light-Emitting Devices and Their Industrial Applications (LEDIDA 2017) , Yokohama (J), 2017.



17. Knut Müller-Caspary, Martial Duchamp, Florian F. Krause, Armand Beche, Marco Schowalter, Florian Winkler, Stefan Löffler, Heike Soltau, Josef Zweck, Peter Schattschneider, Johan Verbeeck, Sandra Van Aert, Rafal Dunin-Borkowski, and Andreas Rosenauer. Mapping atomic electric fields and charge densities by four-dimensional STEM (Invited Talk). In 24th Congress & General Assembly of the International Union of Crystallography (IUCR 2017), Hyderabat (Indien), 2017.



18. Knut Müller-Caspary, Martial Duchamp, Florian F. Krause, Armand Beche, Florian Winkler, Stefan Löffler, Heike Soltau, Josef Zweck, Johan Verbeeck, Sandra Van Aert, Rafal Dunin-Borkowski, and Andreas Rosenauer. Mapping atomic electric fields and charge densities by momentum-resolved STEM (Invited Talk). In Microscopy Conference 2017 (MC 2017), Lausanne (CH), 2017.



19. Andreas Rosenauer, Florian F Krause, Marco Schowalter, Elias Goldmann, Frank Jahnke, Matthias Paul, Michael Jetter, Peter Michler, Marcus Müller, Peter Veit, Jürgen Christen, Tilman Schimpke, Adrian Avramescu, Martin Strassburg, and Jan-Philipp Ahl. Quantitative STEM: Comparative Studies of Composition and Optical Properties of Semiconductor Quantum Structures (Invited Talk). In Microscopy & Microanalysis 2017 Meeting (M&M 2017), St. Louis (USA), 2017.



20. Marco Schowalter, Beeke Geerken, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Annick De Backer, Sandra Van Aert, and Andreas Rosenauer. A comparison of the simulation based and statistics based atomic counting techniques (Poster). In 4th Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO 2017), Vaalsbroek (NL), 2017.



21. Marco Schowalter, Florian Fritz Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Influence of Microscope Imperfections and Detector Characteristics on Quantification of HAADF STEM images (Invited Talk). In 5th Annual Conference of AnalytiX (AnalytiX 2017), Fukuoka (J), 2017.



22. K.H.W. van den Bos, N. Gauquelin, A. Beche, F.F. Krause, I. Lobato, S. Lazar, A. Rosenauer, S. Van Aert, and J. Verbeeck. Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques (Talk). In Microscience Microscopy Congress 2017 (MMC 2017), Manchester (UK), 2017.



23. Marcos Alania, Annick De Backer, Ivan Lobato, Florian F. Krause, Dirk Van Dyck, Andreas Rosenauer, and Sandra Van Aert. How precise can atoms of a nanocluster be located in 3D from a tilt series of scanning transmission electron microscopy images? (Poster). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



24. Tim Grieb, Florian F. Krause, Christoph Mahr, Knut Müller, and Andreas Rosenauer. Optimization of NBED simulations to predict experimental disc-detection measurements (Talk). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



25. F. F. Krause, A. Rosenauer, M. Schowalter, K. Müller-Caspary, T. Mehrtens, A. Beche, K.W.H. van den Bos, S. Van Aert, J. Verbeeck, and D. Van Dyck. Increased Resolution with the ISTEM mode (Talk). In Treffen des Arbeitskreises Hochauflösung (AKHREM) 2016, Berlin (D), 2016.



26. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Measurement of Diffraction Pattern Distortions for Quantitative STEM (Poster). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



27. Florian F. Krause, Marco Schowalter, Thorsten Mehrtens, Knut Müller-Caspary, Armand Beche, Karel W. H. van den Bos, Sandra Van Aert, Johan Verbeeck, and Andreas Rosenauer. ISTEM: A Realisation of Incoherent Imaging for Ultra-High Resolution TEM beyond the Classical Information Limit (Talk). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



28. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, Anastasia Lackmann, Arne Wittstock, and Andreas Rosenauer. Measurement of strain in nanoporous gold using nano-beam electron diffraction. In European Microscopy Congress 2016 (EMC 2016), Lyon (F), [Poster IM06-352], 2016.



29. M. Müller, S. Metzner, T. Hempel, P. Veit, F. Bertram, F F Krause, T. Mehrtens, K. Müller-Caspary, A Rosenauer, T. Schimpke, A. Avramescu, M. Strassburg, and J. Christen. Optical, structural and compositional nano-scale characterization of InGaN/GaN core-shell microrod heterostructucom (Talk). In Proceedings of the Society of Photo-Optical Instrumentation Engineers Photonics West 2016 (SPIE Photonics West 2016) , San Francisco (USA), 2016.



30. M. Müller, S. Metzner, T. Hempel, P. Veit, F. Bertram, F F Krause, T Mehrtens, K. Müller-Caspary, A Rosenauer, T. Schimpke, A. Avramescu, M. Strassburg, and J. Christen. Optical, structural and compositional nano-scale characterization of InGaN/GaN core-shell microrod heterostructures (Talk). In Society of Photo-Optical Instrumentation Engineers Photonics West 2016 (SPIE Photonics West 2016) , San Francisco (USA), 2016.



31. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Martial Duchamp, Tim Grieb, Marco Schowalter, Stefan Löffler, Oliver Oppermann, Vadim Migunov, Florian Winkler, Heike Soltau, Lothar Strüder, Josef Zweck, Peter Schattschneider, Rafal Dunin-Borkowski, Johan Verbeeck, and Andreas Rosenauer. Momentum-resolved STEM: Measurement of atomic electric fields and angular multi-range analysis [Invited talk]. In The XXXVII Annual Meeting of the Electron Microscopy Society of India - International Conference on Electron Microscopy, 2016. Keyword(s): DPC, iris, picodiffraction, electric fields, ARSTEM.



32. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Martial Duchamp, Marco Schowalter, Stefan Löffler, Vadim Migunov, Florian Winkler, Martin Huth, Robert Ritz, Sebastian Ihle, Martin Simson, Henning Ryll, Heike Soltau, Lothar Strüder, Josef Zweck, Peter Schattschneider, Rafal Dunin-Borkowski, Johan Verbeeck, and Andreas Rosenauer. Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors. In Microscopy and Microanalysis 2016, Columbus (OH/USA), [Invited Talk], volume 22, pages 484--485, July 24-28th 2016. Microscopy Society of America. Keyword(s): DPC, pnccd.



33. Knut Müller-Caspary, Thorsten Mehrtens, Marco Schowalter, Tim Grieb, Andreas Rosenauer, Florian F. Krause, Christoph Mahr, and Pavel Potapov. ImageEval. A software for the processing, evaluation and acquisition of (S)TEM images. In European Microscopy Congress 2016, Lyon (F), [Poster IM03-286], 2016.



34. K. Müller-Caspary, O. Oppermann, T. Grieb, A. Rosenauer, F. F. Krause, M. Schowalter, T. Mehrtens, P. Potapov, A. Beyer, and K. Volz. Angle-resolved scanning transmission electron microscopy employing an iris aperture (Poster). In Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham (UK), 2016.



35. Knut Müller-Caspary, Oliver Oppermann, Tim Grieb, Andreas Rosenauer, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Pavel Potapov, Andreas Beyer, and Kerstin Volz. Angle-resolved Scanning Transmission Electron Microscopy (ARSTEM) for materials analysis. In European Microscopy Congress 2016, Lyon (F), [Poster IM06-350], 2016.



36. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, and T. Mehrtens. Analysis of composition and strain in semiconductor nanostructures by quantitative HAADF-STEM and imaging STEM. In PCSI 2016, Santa Barbara (US), 2016.



37. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, T. Mehrtens, A. Beche, J. Verbeeck, V. Galioit, J. Zweck, Stefan Löffler, and Peter Schattschneider. Quantitative STEM - From composition to atomic electric fields (Invited Talk). In Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham (UK), 2016.



38. Andreas Rosenauer, Knut Müller-Caspary, Marco Schowalter, Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Armand Beche, Johan Verbeeck, Josef Zweck, Stefan Löffler, Peter Schattschneider, Marcus Müller, Peter Veit, Sebastian Metzner, Frank Bertram, Tilman Schimpke, Martin Strassburg, and Rafal Dunin-Borkowski. Quantitative STEM -- From composition to atomic electric fields [Invited Talk]. In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



39. Marco Schowalter, Beeke Geerken, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Andreas Rosenauer, and Sandra Van Aert. Atom-counting in a non-probe corrected STEM (Poster). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



40. M. Schowalter, F. F. Krause, T. Grieb, K. Müller-Caspary, T. Mehrtens, and A. Rosenauer. Effects of instrument imperfections on quantitative scanning transmission electron Microscopy (Poster). In Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham (UK), 2016.



41. M. Schowalter, F. F. Krause, T. Grieb, K. Müller-Caspary, and T. Mehrtens A. Rosenauer. Effects of instrument imperfections on quantitative scanning transission electron microscopy. In PCSI 2016, Santa Barbara (US), 2016.



42. Yi Wang, Dan Zhou, Wilfried Sigle, E. Suyolcu, Knut Müller-Caspary, Florian F. Krause, Andreas Rosenauer, and Peter A. van Aken. Precision and application of atom location in HAADF and ABF [Talk in IM05-II]. In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



43. Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F. Krause, Andreas Rosenauer, and Peter van Aken. Sample tilt effects on atom column position determination in ABF-STEM imaging. In Microscopy and Microanalysis Conference M&M 2016, Columbus (Ohio, USA), session A15.1, [Talk 19], July 24-28th 2016.



44. Karel H W van den Bos, Florian F. Krause, Armand Beche, Johan Verbeeck, Andreas Rosenauer, and Sandra Van Aert. Precise atomic column position measurements using ISTEM (Poster). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



45. Florian F. Krause, Jan-Philipp Ahl, Darius Tytko, Pyuck-Pa Choi, Ricardo Egoavil, Marco Schowalter, Thorsten Mehrtens, Knut Müller-Caspary, Johan Verbeeck, Dierk Raabe, Joachim Hertkorn, Karl Engl, and Andreas Rosenauer. Homogeneity and Composition of MOVPE-Grown AlInGaN: A Nanostructure Multiprobe Study (Poster). In Proceedings of the Microscopy Conference 2015 (MC 2015), Göttingen (D), September 6-11th 2015.



46. F F Krause, A Rosenauer, Müller K., M Schowalter, and T Mehrtens. Imaging STEM: A novel method for microscopy of semiconductors at ultra-high spatial resolution and precision (Talk). In Proceedings of Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK), volume Session 4b (Wed, April 1st), 2015.



47. Florian Fritz Krause, Andreas Rosenauer, Knut Müller-Caspary, Marco Schowalter, and Thorsten Mehrtens. Conventional Transmission Electron Microscopy Imaging beyond the Diffraction and Information Limits. In Frontiers of Electron Microscopy in Materials Science (FEMMS) 2015, Lake Tahoe (CA/USA), [Invited Talk], September 13-18th 2015.



48. F. F. Krause, A. Rosenauer, M. Schowalter, K. Müller-Caspary, and T. Mehrtens. ISTEM: A novel incoherent imaging mode for ultra-high resolution beyond the classical information limit (Talk). In Proceedings of the Microscopy Conference 2015 (MC 2015), Göttingen (D), September 6-11th 2015.



49. Florian F. Krause, M. Schowalter, J.P. Ahl, J. Hertkorn, R. Egoavil, d. Tytko, P. P. Choi, T. Mehrtens, K. Müller-Caspary, D. Raabe, J. Verbeeck, K. Engl, and A. Rosenauer. Homogeneity and composition of MOVPE grown AlInGaN: a multiprobe nanostructure study. In Proceedings of Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK), 2015.



50. Johannes Ledig, Tilman Schimpke, Gregor Scholz, Florian F. Krause, Andreas Rosenauer, Martin Strassburg, Hergo-Heinrich Wehmann, and Andreas Waag. Comparison of electroluminescence and IV characteristics along a GaN based core-shell LED taken by point contacts inside a CL-SEM (Poster). In Proceedings of the Microscopy Conference 2015 (MC 2015), Göttingen (D), 2015.



51. Christoph Mahr, Knut Müller, Marco Schowalter, Thorsten Mehrtens, Tim Grieb, Florian F. Krause, Daniel Erben, and Andreas Rosenauer. Analysis and improvement of precision and accuracy of strain measurements by convergent nano-beam electron diffraction (SANBED). In Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK) [Talk], volume Session 3b, Tue, March 31st, 2015.



52. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Thorsten Mehrtens, Marco Schowalter, Florian F. Krause, Dennis Zillmann, and Andreas Rosenauer. Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction (SANBED). In Microscopy Conference MC 2015, Göttingen (D), session MS 2, [Poster MS2.P023], September 6-11th 2015.



53. Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. A quantum mechanical approach to electron picodiffraction reveals atomic electric fields. In Materials Research Society Spring Meeting 2015 (MRS 2015), San Francisco (USA) [Talk], volume Symposium ZZ, Talk 2.02, 2015.



54. Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields. In Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK) [Talk], volume Session 4b (Wed, April 1st), 2015.



55. M. Müller, S. Metzner, T. Hempel, P. Veit, F. Bertram, F. F. Krause, T. Mehrtens, K. Müller-Caspary, A. Rosenauer, T. Schimpke, M. Strassburg, and J. Christen. Nanoscale Characterization of InGaN/GaN core-shell microrods: Correlation of the optical properties and the composition of the InGaN single quantum well (Talk). In Proceedings of the International Conference on Nitride Semiconductors 2015 (ICNS 11), Peking (CHN), 2015.



56. K. Müller-Caspary, F. F. Krause, A. Béché, M. Schowalter, V. Galioit, S. L[öffler, J. Verbeeck, J. Zweck, P. Schattschneider, and A. Rosenauer. Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields. In Microscopy Conference MC 2015, Göttingen (D), session IM 5, [Talk], September 6-11th 2015.



57. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Oliver Oppermann, Tim Grieb, Andreas Oelsner, Pavel Potapov, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields. In Frontiers of Electron Microscopy in Materials Science (FEMMS) 2015, Lake Tahoe (CA/USA), [Invited Talk], September 13-18th 2015.



58. Andreas Rosenauer, Florian F. Krause, Knut Müller, Marco Schowalter, and Thorsten Mehrtens. Conventional Transmission Electron Microscopy Imaging beyond the Diffraction and Information Limits. In Materials Research Society Spring Meeting 2015 (MRS 2015), San Francisco (USA) [Talk], volume Symposium ZZ, Talk 2.02, 2015.



59. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, and T. Mehrtens. Analysis of composition and strain in semiconductor nanostructures by quantitative STEM using HAADF intensity, angular multi-range analysis and imaging STEM. In Microscopy Conference MC 2015, Göttingen (D), Session MS 2 [Invited Talk], September 6-11th 2015.



60. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F.F. Krause, T. Mehrtens, A. Béché, J. Verbeeck, V. Galioit, J. Zweck, Stefan Löffler, and Peter Schattschneider. Quantitative STEM. In Proceedings of the International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices 2015 (IAMNANO 2015) [Invited Talk], Hamburg (D), 2015.



61. Marco Schowalter, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Effects of Instrument Imperfections on Quantitative Scanning Transmission Electron Microscopy (Poster. In Proceedings of the Microscopy Conference 2015 (MC 2015), Göttingen (D), September 6-11th 2015.



62. Marco Schowalter, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Investigation of detector characteristics for quantification of HAADF-STEM images (Poster). In Proceedings of Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK), 2015.



63. Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F. Krause, Andreas Rosenauer, and Peter van Aken. Effects of small sample tilt on atomic column position determination in ABF-STEM imaging. In Microscopy Conference MC 2015, Göttingen (D), session IM 2, [Poster IM2.P055], September 6-11th 2015.



64. Josef Zweck, Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Peter Schattschneider, and Andreas Rosenauer. Exploring the space between atoms: Interatomic electric fields imaged by STEM-DPC. In Multinational Congress on Microscopy (MCM) 2015, Eger (Hungary) [Invited talk], 2015.



65. Jan-Philipp Ahl, Joachim Hertkorn, Anna Nirschl, Michael Benedikt, Bernhard Holländer, Florian F. Krause, Pyuck-Pa Choi, Dierk Raabe, and Andreas Rosenauer. On the possibility to use quaternary AlInGaN for polarization engineering (Talk). In Proceedings of the International Conference on Metalorganic Vapor Phase Epitaxy 2014 (ICMOVPE 17), Lausanne (CH), 2014.



66. F. F. Krause, Müller K., D. Zillmann, J. Jansen, M. Schowalter, and A. Rosenauer. Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods (Poster). In Proceedings of the 18th International Microscopy Congress (IMC), Prag (CZ), 2014.



67. T. Schimpke, M. Binder, B. Galler, J. Hartmann, A. Waag, F. F. Krause, T. Mehrtens, A. Rosenauer, M. Müller, S. Metzner, P. Veit, F. Bertram, J. Christen, and H-J. Lugauer M. Strassburg1. Control of emission wavelength gradient along the m-plane facet of high aspect-ratio core-shell InGaN/GaN microrod LED structures (Talk). In Proceedings des Arbeitskreistreffens der Deutsche Gesellschaft für Kristallwachstum und Kristallzüchtung e.V. Arbeitskreis Epitaxie von III-V-Halbleitern 2014(AK III-V DGKK 29), Magdeburg (D), 2014.



68. M. Schowalter, F. Krause, T. Grieb, T. Mehrtens, K. Müller, and A. Rosenauer. Position resolved single electron response of the HAADF-STEM detector and improved method for intensity normalisation. In 18th International Microscopy Congress (IMC) [Talk IT-2-O-3292], 2014.



69. Florian F. Krause, Knut Müller, Dennis Zillmann, Jacob Jansen, Marco Schowalter, and Andreas Rosenauer. Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods (Poster). In Proceedings of the Microscopy Conference 2013 (MC 2013), Regensburg (D), volume 1: Instrumentation and Methods, pages IM.1.P022, 2013.



70. Marco Schowalter, Ingo Stoffers, Florian Krause, Thorsten Mehrtens, Knut Müller, Malte Fandrich, Timo Aschenbrenner, Detlef Hommel, and Andreas Rosenauer. Composition determination using HAADF-STEM in AlGaN/GaN heterostructures revisited. In Microscopy Conference 2013 (MC 2013, Regensburg) [Poster Presentation], volume 1: Instrumentation and Methods, pages IM.1.P028, 2013.



71. Ingo Stoffers, Marco Schowalter, Florian Krause, Thorsten Mehrtens, Knut Müller, Malte Fandrich, Timo Aschenbrenner, Detlef Hommel, and Andreas Rosenauer. Composition quantification from HAADF-STEM in AlGaN/GaN heterostructures revisited. In Microscopy of Semiconducting Materials 2013 (MSMX VIII),Oxford (UK) [Poster Presentation], 2013.



72. Moritz Tewes, Florian Krause, Knut Müller, Pavel Potapov, Marco Schowalter, Thorsten Mehrtens, and Andreas Rosenauer. Quantitative Composition Evaluation from HAADF-STEM in GeSi/Si Heterostructures. In Microscopy of Semiconducting Materials 2013 (MSM XVIII),Oxford (UK) [Talk], 2013.

1. Knut Müller, Thorsten Mehrtens, Florian Krause, Marco Schowalter, and Andreas Rosenauer. Simulation of STEM images [Invited talk], February 2014.

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