1. Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Saleh Firoozabadi, Christoph Mahr, Marco Schowalter, Andreas Beyer, Oliver Oppermann, Kerstin Volz, and Andreas Rosenauer. Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si. Ultramicroscopy, 221:113175, 2021. Keyword(s): Angle-resolved STEM, Quantitative STEM, Plasmon excitation, Inelastic scattering, Phonon correlation, Low-angle scattering.



2. Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Robert Ritz, Martin Simson, Jörg Schörmann, Christoph Mahr, Jan Müssener, Marco Schowalter, Heike Soltau, Martin Eickhoff, and Andreas Rosenauer. 4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection. Ultramicroscopy, 228:113321, 2021. Keyword(s): Electric fields, 4D STEM, Interfaces, COM, NBED.



3. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, and Andreas Rosenauer. Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods. Ultramicroscopy, 221:113196, 2021. Keyword(s): Strain measurement, Ptychography, Interface, 4D-STEM, Patterned apertures.



4. Andreas Beyer, Florian F Krause, Hoel L Robert, Saleh Firoozabadi, Tim Grieb, Pirmin Kükelhan, Damien Heimes, Marco Schowalter, Knut Müller-Caspary, Andreas Rosenauer, and Kerstin Volz. Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy. Scientific Reports, 10:1--15, 2020.



5. Christoph Mahr, Knut Müller-Caspary, Robert Ritz, Martin Simson, Tim Grieb, Marco Schowalter, Florian F. Krause, Anastasia Lackmann, Heike Soltau, Arne Wittstock, and Andreas Rosenauer. Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction. Ultramicroscopy, 196:74 - 82, 2019. Keyword(s): Strain measurement, Electron diffraction, Image distortions, 4D-STEM, Nanoporous gold.



6. Knut Müller-Caspary, Tim Grieb, Jan Müssener, Nicolas Gauquelin, Pascal Hille, Jörg Schörmann, Johan Verbeeck, Sandra Van Aert, Martin Eickhoff, and Andreas Rosenauer. Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy. Phys. Rev. Lett., 122:106102, March 2019.



7. Tim Grieb, Florian F. Krause, Marco Schowalter, Dennis Zillmann, Roman Sellin, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Dieter Bimberg, and Andreas Rosenauer. Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence. Ultramicroscopy, 190:45 - 57, 2018.



8. Tim Grieb, M. Tewes, Marco Schowalter, Knut Müller-Caspary, Florian F. Krause, Thorsten Mehrtens, and Andreas Rosenauer. Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation. Ultramicroscopy, 184:29-36, 2018. Keyword(s): NBED, Disc detection, Strain, Electric field measurement.



9. Christoph Mahr, Knut Müller-Caspary, Matthias Graf, Anastasia Lackmann, Tim Grieb, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Arne Wittstock, Jörg Weissmüller, and Andreas Rosenauer. Measurement of local crystal lattice strain variations in dealloyed nanoporous gold. Materials Research Letters, 6(1):84-92, 2018.



10. C. Carmesin, M. Schowalter, M. Lorke, D. Mourad, T. Grieb, K. Müller-Caspary, M. Yacob, J. P. Reithmaier, M. Benyoucef, A. Rosenauer, and F. Jahnke. Interplay of morphology, composition, and optical properties of InP-based quantum dots emitting at the $1.55\phantom{\rule{0.28em}{0ex}}\ensuremath{\mu}\mathrm{m}$ telecom wavelength. Phys. Rev. B, 96:235309, December 2017.



11. Tim Grieb, Florian F. Krause, Christoph Mahr, Dennis Zillmann, Knut Müller-Caspary, Marco Schowalter, and Andreas Rosenauer. Optimization of NBED simulations for disc-detection measurements. Ultramicroscopy, 181:50 - 60, 2017. Keyword(s): NBED, Disc detection, Strain, Electric field measurement.



12. Knut Müller-Caspary, Florian F. Krause, Tim Grieb, Stefan Löffler, Marco Schowalter, Armand Béché, Vincent Galioit, Dennis Marquardt, Josef Zweck, Peter Schattschneider, Johan Verbeeck, and Andreas Rosenauer. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy. Ultramicroscopy, 178:62-80, 2017. Keyword(s): TEM.



13. T. Aschenbrenner, M. Schowalter, T. Mehrtens, K. Müller-Caspary, M. Fikry, D. Heinz, I. Tischer, M. Madel, K. Thonke, D. Hommel, F. Scholz, and A.ahr Rosenauer. Composition analysis of coaxially grown InGaN multi quantum wells using scanning transmission electron microscopy. Journal of Applied Physics, 119(17), 2016.



14. Daniel Carvalho, Knut Müller-Caspary, Marco Schowalter, Tim Grieb, Thorsten Mehrtens, Andreas Rosenauer, Rafael Ben, Teresa Garcìa, Andrés Redondo-Cubero, Katharina Lorenz, Bruno Daudin, and Francisco M. Morales. Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction. Scientific Reports, 6:28459, June 2016. Keyword(s): DPC, strain, NBD, SANBED, nano-beam electron diffraction, polarization, polarisation, piezoelectric.



15. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Effects of instrument imperfections on quantitative scanning transmission electron microscopy. Ultramicroscopy, 161:146--160, 2016. Keyword(s): TEM.



16. Matthias Lohr, Ralph Schregle, Michael Jetter, Clemens Wächter, Knut Müller-Caspary, Thorsten Mehrtens, Andreas Rosenauer, Ines Pietzonka, Martin Strassburg, and Josef Zweck. Quantitative measurements of internal electric fields with differential phase contrast microscopy on InGaN/GaN quantum well structures. physica status solidi (b), 253:140--144, 2016. Keyword(s): DPC, Efficiency droop, EFTEM, electric fields, GaN, HAADF, IMFP, MQW, QCSE, quantification, STEM.



17. K. Müller-Caspary, O. Oppermann, T. Grieb, F. F. Krause, A. Rosenauer, M. Schowalter, T. Mehrtens, A. Beyer, K. Volz, and P. Potapov. Materials characterisation by angle resolved scanning transmission electron microscopy. Scientific Reports, 6:37146, 2016.



18. H. Ryll, M. Simson, R. Hartmann, P. Holl, M. Huth, S. Ihle, Y. Kondo, P. Kotula, A. Liebel, K. Müller-Caspary, A. Rosenauer, R. Sagawa, J. Schmidt, H. Soltau, and L. Strüder. A pnCCD-based, fast direct single electron imaging camera for TEM and STEM. Journal of Instrumentation, 11(04):P04006, 2016.



19. Marc Sauerbrey, Jan Höcker, Meikel Wellbrock, Marco Schowalter, Jon-Olaf Krisponeit, Knut Müller-Caspary, Andreas Rosenauer, Gang Wei, Lucio Colombi Ciacchi, Jens Falta, and Jan Ingo Flege. Ultrasmooth Ru(0001) Films as Templates for Ceria Nanoarchitectures. Crystal Growth & Design, 16(8):4216--4224, 2016.



20. P. S. Sokolov, M. Yu. Petrov, T. Mehrtens, K. Müller-Caspary, A. Rosenauer, D. Reuter, and A. D. Wieck. Reconstruction of nuclear quadrupole interaction in (In,Ga)As/GaAs quantum dots observed by transmission electron microscopy. Phys. Rev. B, 93:045301, January 2016.



21. Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F. Krause, Andreas Rosenauer, and van Aken Peter. Sample tilt effects on atom column position determination in ABF-STEM imaging. Ultramicroscopy, 160:110--117, 2016. Keyword(s): Annular bright-field imaging.



22. Florian F. Krause, Jan-Philipp Ahl, Darius Tytko, Pyuck-Pa Choi, Ricardo Egoavil, Marco Schowalter, Thorsten Mehrtens, Knut Müller-Caspary, Johan Verbeeck, Dierk Raabe, Joachim Hertkorn, Karl Engl, and Andreas Rosenauer. Homogeneity and composition of AlInGaN: A multiprobe nanostructure study. Ultramicroscopy, 156(0):29--36, 2015. Keyword(s): HAADF STEM.



23. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Marco Schowalter, Thorsten Mehrtens, Florian. F. Krause, Dennis Zillmann, and Andreas Rosenauer. Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction. Ultramicroscopy, 158(0):38--48, 2015. Keyword(s): Strain measurement.



24. Knut Müller-Caspary. Messung atomarer elektrischer Felder. Physik in unserer Zeit, 46(3):110--111, 2015.



25. Knut Müller-Caspary, Andreas Oelsner, and Pavel Potapov. Two-dimensional strain mapping in semiconductors by nano-beam electron diffracion employing a delay-line detector. Applied Physics Letters, 107:072110, 2015.

1. Tim Grieb, Christoph Mahr, Florian F. Krause, Knut Müller-Caspary, Marco Schowalter, Martin Eickhoff, and Andreas Rosenauer. Measuring electric fields with 4D-STEM: Demonstration of pitfalls by the example of GaN and SiGe. In European Microscopy Congress (EMC) 2024, Kopenhagen (Dänemark), [poster], 2024. Keyword(s): Konferenz.



2. Christoph Mahr, Knut Müller-Caspary, Martin Simson, Robert Ritz, Matthias Graf, Anastasia Lackmann, Tim Grieb, Marco Schowalter, Florian F Krause, Thorsten Mehrtens, Arne Wittstock, Heike Soltau, Jörg Weissmüller, and Andreas Rosenauer. Measurement of local crystal lattice strain variations in dealloyed nanoporous gold (Vortrag). In 19th International Microscopy Congress (IMC) 2018, Sydney (Australien) [Vortrag PS1.3.173], 2018.



3. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Effects of instrument imperfections on high resolution quantitative scanning transmission electron microscopy (Poster). In 4th Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO 2017), Vaalsbroek (NL), 2017.



4. M. Müller, S. Metzner, T. Hempel, P. Veit, F. Bertram, F F Krause, T Mehrtens, K. Müller-Caspary, A Rosenauer, T. Schimpke, A. Avramescu, M. Strassburg, and J. Christen. Accessing optical and compositional properties of InGaN/GaN core-shell nanorods at the nanometer scale (Talk). In 9th International Conference on Materials for Advanced Technologies (ICMAT 2017) , Singapur (Singapur), 2017.



5. M. Müller, S. Metzner, T. Hempel, P. Veit, F. Bertram, F F Krause, T Mehrtens, K. Müller-Caspary, A Rosenauer, T. Schimpke, A. Avramescu, M. Strassburg, and J. Christen. Nano-scale correlation of the optical, structural, and compositional properties of InGaN/GaN core-shell nanorod LEDs (Talk). In 5th International Conference on Light-Emitting Devices and Their Industrial Applications (LEDIDA 2017) , Yokohama (J), 2017.



6. Knut Müller-Caspary, Martial Duchamp, Florian F. Krause, Armand Beche, Marco Schowalter, Florian Winkler, Stefan Löffler, Heike Soltau, Josef Zweck, Peter Schattschneider, Johan Verbeeck, Sandra Van Aert, Rafal Dunin-Borkowski, and Andreas Rosenauer. Mapping atomic electric fields and charge densities by four-dimensional STEM (Invited Talk). In 24th Congress & General Assembly of the International Union of Crystallography (IUCR 2017), Hyderabat (Indien), 2017.



7. Knut Müller-Caspary, Martial Duchamp, Florian F. Krause, Armand Beche, Florian Winkler, Stefan Löffler, Heike Soltau, Josef Zweck, Johan Verbeeck, Sandra Van Aert, Rafal Dunin-Borkowski, and Andreas Rosenauer. Mapping atomic electric fields and charge densities by momentum-resolved STEM (Invited Talk). In Microscopy Conference 2017 (MC 2017), Lausanne (CH), 2017.



8. M. Schowalter, C. Carmesin, M. Lorke, D. Mourad, T. Grieb, K. Müller-Caspary, M. Yacob, J. P. Reithmaier, M. Benyoucef, A. Rosenauer, and F. Jahnke. The influence of morphology of InAs/InAlGaAs quantum dots emitting in the low-loss telecom wavelength range. In MC 2017, Lausanne (CH), 2017.



9. Marco Schowalter, Beeke Geerken, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Annick De Backer, Sandra Van Aert, and Andreas Rosenauer. A comparison of the simulation based and statistics based atomic counting techniques (Poster). In 4th Conference on Frontiers of Aberration Corrected Electron Microscopy (PICO 2017), Vaalsbroek (NL), 2017.



10. Marco Schowalter, Florian Fritz Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Influence of Microscope Imperfections and Detector Characteristics on Quantification of HAADF STEM images (Invited Talk). In 5th Annual Conference of AnalytiX (AnalytiX 2017), Fukuoka (J), 2017.



11. F. F. Krause, A. Rosenauer, M. Schowalter, K. Müller-Caspary, T. Mehrtens, A. Beche, K.W.H. van den Bos, S. Van Aert, J. Verbeeck, and D. Van Dyck. Increased Resolution with the ISTEM mode (Talk). In Treffen des Arbeitskreises Hochauflösung (AKHREM) 2016, Berlin (D), 2016.



12. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Measurement of Diffraction Pattern Distortions for Quantitative STEM (Poster). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



13. Florian F. Krause, Marco Schowalter, Thorsten Mehrtens, Knut Müller-Caspary, Armand Beche, Karel W. H. van den Bos, Sandra Van Aert, Johan Verbeeck, and Andreas Rosenauer. ISTEM: A Realisation of Incoherent Imaging for Ultra-High Resolution TEM beyond the Classical Information Limit (Talk). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



14. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Florian F. Krause, Marco Schowalter, Anastasia Lackmann, Arne Wittstock, and Andreas Rosenauer. Measurement of strain in nanoporous gold using nano-beam electron diffraction. In European Microscopy Congress 2016 (EMC 2016), Lyon (F), [Poster IM06-352], 2016.



15. Christoph Mahr, Knut Müller-Caspary, Andreas Oelsner, Andreas Rosenauer, and Pavel Potapov. STEM strain measurement from a stream of diffraction patterns recorded on a pixel-free delay-line detector [Talk]. In EMAG conference 2016, Durham, UK, 2016.



16. M. Müller, S. Metzner, T. Hempel, P. Veit, F. Bertram, F F Krause, T. Mehrtens, K. Müller-Caspary, A Rosenauer, T. Schimpke, A. Avramescu, M. Strassburg, and J. Christen. Optical, structural and compositional nano-scale characterization of InGaN/GaN core-shell microrod heterostructucom (Talk). In Proceedings of the Society of Photo-Optical Instrumentation Engineers Photonics West 2016 (SPIE Photonics West 2016) , San Francisco (USA), 2016.



17. M. Müller, S. Metzner, T. Hempel, P. Veit, F. Bertram, F F Krause, T Mehrtens, K. Müller-Caspary, A Rosenauer, T. Schimpke, A. Avramescu, M. Strassburg, and J. Christen. Optical, structural and compositional nano-scale characterization of InGaN/GaN core-shell microrod heterostructures (Talk). In Society of Photo-Optical Instrumentation Engineers Photonics West 2016 (SPIE Photonics West 2016) , San Francisco (USA), 2016.



18. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Martial Duchamp, Tim Grieb, Marco Schowalter, Stefan Löffler, Oliver Oppermann, Vadim Migunov, Florian Winkler, Heike Soltau, Lothar Strüder, Josef Zweck, Peter Schattschneider, Rafal Dunin-Borkowski, Johan Verbeeck, and Andreas Rosenauer. Momentum-resolved STEM: Measurement of atomic electric fields and angular multi-range analysis [Invited talk]. In The XXXVII Annual Meeting of the Electron Microscopy Society of India - International Conference on Electron Microscopy, 2016. Keyword(s): DPC, iris, picodiffraction, electric fields, ARSTEM.



19. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Martial Duchamp, Marco Schowalter, Stefan Löffler, Vadim Migunov, Florian Winkler, Martin Huth, Robert Ritz, Sebastian Ihle, Martin Simson, Henning Ryll, Heike Soltau, Lothar Strüder, Josef Zweck, Peter Schattschneider, Rafal Dunin-Borkowski, Johan Verbeeck, and Andreas Rosenauer. Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors. In Microscopy and Microanalysis 2016, Columbus (OH/USA), [Invited Talk], volume 22, pages 484--485, July 24-28th 2016. Microscopy Society of America. Keyword(s): DPC, pnccd.



20. Knut Müller-Caspary, Thorsten Mehrtens, Marco Schowalter, Tim Grieb, Andreas Rosenauer, Florian F. Krause, Christoph Mahr, and Pavel Potapov. ImageEval. A software for the processing, evaluation and acquisition of (S)TEM images. In European Microscopy Congress 2016, Lyon (F), [Poster IM03-286], 2016.



21. Knut Müller-Caspary, Andreas Oelsner, and Pavel Potapov. STEM Strain Measurement From a Stream of Diffraction Patterns Recorded on a Pixel-Free Delay-Line Detector. In Microscopy and Microanalysis 2016, Columbus (OH/USA), [Poster], July 24-28th 2016.



22. Knut Müller-Caspary, Andreas Oelsner, Pavel Potapov, and Thomas Schmidt. Analysis of strain and composition in GeSi/Si heterostructures by electron microscopy. In European Microscopy Congress 2016, Lyon (F), [Talk MS03-OP239], 2016.



23. K. Müller-Caspary, O. Oppermann, T. Grieb, A. Rosenauer, F. F. Krause, M. Schowalter, T. Mehrtens, P. Potapov, A. Beyer, and K. Volz. Angle-resolved scanning transmission electron microscopy employing an iris aperture (Poster). In Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham (UK), 2016.



24. Knut Müller-Caspary, Oliver Oppermann, Tim Grieb, Andreas Rosenauer, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Pavel Potapov, Andreas Beyer, and Kerstin Volz. Angle-resolved Scanning Transmission Electron Microscopy (ARSTEM) for materials analysis. In European Microscopy Congress 2016, Lyon (F), [Poster IM06-350], 2016.



25. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, and T. Mehrtens. Analysis of composition and strain in semiconductor nanostructures by quantitative HAADF-STEM and imaging STEM. In PCSI 2016, Santa Barbara (US), 2016.



26. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, T. Mehrtens, A. Beche, J. Verbeeck, V. Galioit, J. Zweck, Stefan Löffler, and Peter Schattschneider. Quantitative STEM - From composition to atomic electric fields (Invited Talk). In Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham (UK), 2016.



27. Andreas Rosenauer, Knut Müller-Caspary, Marco Schowalter, Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Armand Beche, Johan Verbeeck, Josef Zweck, Stefan Löffler, Peter Schattschneider, Marcus Müller, Peter Veit, Sebastian Metzner, Frank Bertram, Tilman Schimpke, Martin Strassburg, and Rafal Dunin-Borkowski. Quantitative STEM -- From composition to atomic electric fields [Invited Talk]. In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



28. Marco Schowalter, Beeke Geerken, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Andreas Rosenauer, and Sandra Van Aert. Atom-counting in a non-probe corrected STEM (Poster). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



29. M. Schowalter, F. F. Krause, T. Grieb, K. Müller-Caspary, T. Mehrtens, and A. Rosenauer. Effects of instrument imperfections on quantitative scanning transmission electron Microscopy (Poster). In Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham (UK), 2016.



30. M. Schowalter, F. F. Krause, T. Grieb, K. Müller-Caspary, and T. Mehrtens A. Rosenauer. Effects of instrument imperfections on quantitative scanning transission electron microscopy. In PCSI 2016, Santa Barbara (US), 2016.



31. Yi Wang, Dan Zhou, Wilfried Sigle, E. Suyolcu, Knut Müller-Caspary, Florian F. Krause, Andreas Rosenauer, and Peter A. van Aken. Precision and application of atom location in HAADF and ABF [Talk in IM05-II]. In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



32. Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F. Krause, Andreas Rosenauer, and Peter van Aken. Sample tilt effects on atom column position determination in ABF-STEM imaging. In Microscopy and Microanalysis Conference M&M 2016, Columbus (Ohio, USA), session A15.1, [Talk 19], July 24-28th 2016.



33. Tim Grieb, Daniel Carvalho, Knut Müller-Caspary, Marco Schowalter, Christoph Mahr, Andreas Beyer, Andreas Hyra, T. Ben, F. M. Morales, R. Garcia, Kerstin Volz, B. Daudin, and Andreas Rosenauer. Quantitative nano-beam electron diffraction: Measuring strain and electric fields. In Microscopy Conference MC 2015, Göttingen (D), Session IM 2 [Talk], September 6-11th 2015.



34. Florian F. Krause, Jan-Philipp Ahl, Darius Tytko, Pyuck-Pa Choi, Ricardo Egoavil, Marco Schowalter, Thorsten Mehrtens, Knut Müller-Caspary, Johan Verbeeck, Dierk Raabe, Joachim Hertkorn, Karl Engl, and Andreas Rosenauer. Homogeneity and Composition of MOVPE-Grown AlInGaN: A Nanostructure Multiprobe Study (Poster). In Proceedings of the Microscopy Conference 2015 (MC 2015), Göttingen (D), September 6-11th 2015.



35. Florian Fritz Krause, Andreas Rosenauer, Knut Müller-Caspary, Marco Schowalter, and Thorsten Mehrtens. Conventional Transmission Electron Microscopy Imaging beyond the Diffraction and Information Limits. In Frontiers of Electron Microscopy in Materials Science (FEMMS) 2015, Lake Tahoe (CA/USA), [Invited Talk], September 13-18th 2015.



36. F. F. Krause, A. Rosenauer, M. Schowalter, K. Müller-Caspary, and T. Mehrtens. ISTEM: A novel incoherent imaging mode for ultra-high resolution beyond the classical information limit (Talk). In Proceedings of the Microscopy Conference 2015 (MC 2015), Göttingen (D), September 6-11th 2015.



37. Florian F. Krause, M. Schowalter, J.P. Ahl, J. Hertkorn, R. Egoavil, d. Tytko, P. P. Choi, T. Mehrtens, K. Müller-Caspary, D. Raabe, J. Verbeeck, K. Engl, and A. Rosenauer. Homogeneity and composition of MOVPE grown AlInGaN: a multiprobe nanostructure study. In Proceedings of Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK), 2015.



38. Christoph Mahr, Knut Müller-Caspary, Tim Grieb, Thorsten Mehrtens, Marco Schowalter, Florian F. Krause, Dennis Zillmann, and Andreas Rosenauer. Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction (SANBED). In Microscopy Conference MC 2015, Göttingen (D), session MS 2, [Poster MS2.P023], September 6-11th 2015.



39. Thorsten Mehrtens, Marco Schowalter, Jakob Borchardt, Max Grimme, Knut Müller-Caspary, Lars Hoffmann, H. Jönen, U. Rossow, A. Hangleiter, and Andreas Rosenauer. Temperature dependence of HAADF intensity: Influence of disorder. In Microscopy Conference MC 2015, Göttingen (D), session IM 2, [Poster IM2.P049], September 6-11th 2015.



40. M. Müller, S. Metzner, T. Hempel, P. Veit, F. Bertram, F. F. Krause, T. Mehrtens, K. Müller-Caspary, A. Rosenauer, T. Schimpke, M. Strassburg, and J. Christen. Nanoscale Characterization of InGaN/GaN core-shell microrods: Correlation of the optical properties and the composition of the InGaN single quantum well (Talk). In Proceedings of the International Conference on Nitride Semiconductors 2015 (ICNS 11), Peking (CHN), 2015.



41. K. Müller-Caspary, F. F. Krause, A. Béché, M. Schowalter, V. Galioit, S. L[öffler, J. Verbeeck, J. Zweck, P. Schattschneider, and A. Rosenauer. Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields. In Microscopy Conference MC 2015, Göttingen (D), session IM 5, [Talk], September 6-11th 2015.



42. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Oliver Oppermann, Tim Grieb, Andreas Oelsner, Pavel Potapov, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields. In Frontiers of Electron Microscopy in Materials Science (FEMMS) 2015, Lake Tahoe (CA/USA), [Invited Talk], September 13-18th 2015.



43. K. Müller-Caspary, Andreas Oelsner, Andreas Rosenauer, and Pavel Potapov. STEM strain measurement from a stream of diffraction patterns recorded on a pixel-free delay-line detector. In Microscopy Conference MC 2015, Göttingen (D), session IM 1, [Poster IM1.P029], September 6-11th 2015.



44. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, and T. Mehrtens. Analysis of composition and strain in semiconductor nanostructures by quantitative STEM using HAADF intensity, angular multi-range analysis and imaging STEM. In Microscopy Conference MC 2015, Göttingen (D), Session MS 2 [Invited Talk], September 6-11th 2015.



45. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F.F. Krause, T. Mehrtens, A. Béché, J. Verbeeck, V. Galioit, J. Zweck, Stefan Löffler, and Peter Schattschneider. Quantitative STEM. In Proceedings of the International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices 2015 (IAMNANO 2015) [Invited Talk], Hamburg (D), 2015.



46. H. Ryll, M. Simson, C. Boothroyd, R. E. Dunin-Borkowski, C. Dwyer, R. Hartmann, M. Huth, s. Ihle, V. Migunov, K. Müller-Caspary, A. Rosenauer, J. Schmidt, H. Soltau, and L. Strüder. The wave-particle duality of electrons demonstrated with sub-pixel resolution by recording off-axis electron holograms on a pnCCD direct detector. In Microscopy Conference MC 2015, Göttingen (D), Session IM 1 [Invited Talk], September 6-11th 2015.



47. Marco Schowalter, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Effects of Instrument Imperfections on Quantitative Scanning Transmission Electron Microscopy (Poster. In Proceedings of the Microscopy Conference 2015 (MC 2015), Göttingen (D), September 6-11th 2015.



48. Marco Schowalter, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Investigation of detector characteristics for quantification of HAADF-STEM images (Poster). In Proceedings of Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK), 2015.



49. M. Schowalter, A. Rosenauer, K. Müller-Caspary, T. Grieb, and T. Mehrtens. Quantitative STEM. In EAgLE workshop on high-resolution transmission electron microscopy - from sample preparation to interpretation, 21.-25. September 2015, Warsaw, Poland (invited talk), 2015.



50. M. Simson, R. E. Dunin-Borkowski, C. Dwyer, R. Hartmann, M. Huth, S. Ihle, P. Kotula, V. Migunov, K. Müller-Caspary, A. Rosenauer, H. Ryll, J. Schmidt, H. Soltau, L. Strüder, and M. Wollgarten. The pnCCD (S)TEM Camera - A Pixelated, Fast and Direct Detector for TEM and STEM. In PICO conference 2015: Frontiers of aberration-corrected electron microscopy, Kasteel Vaalsbroek (The Netherlands) [Poster], 2015.



51. Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F. Krause, Andreas Rosenauer, and Peter van Aken. Effects of small sample tilt on atomic column position determination in ABF-STEM imaging. In Microscopy Conference MC 2015, Göttingen (D), session IM 2, [Poster IM2.P055], September 6-11th 2015.



52. Christoph Mahr, Knut Müller-Caspary, Andreas Rosenauer, Marco Schowalter, Daniel Erben, Josef Zweck, and Pavel Potapov. Effect of lens aberrations on strain measurements from Convergent Beam Electron Diffraction patterns. In DPG Frühjahrstagung 2013, Regensburg, March, 2013 [Talk MM2.3], 2013.

1. Knut Müller-Caspary. Applications and limitations of momentum-resolved STEM [Talk at the Meeting of the AK-HREM on High-resolution TEM, TU Berlin, Berlin(Germany)], April 2016.



2. Knut Müller-Caspary. Probing electric fields by STEM [Lecture], June 2015.



3. Knut Müller-Caspary and Andreas Rosenauer. STEM and TEM Simulation [Tutorial], June 2015.

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