1. Dennis Marquardt. Strukturelle Analyse von Methylammoniumbleibromid Perowskiten auf Muskovit Mica. Master's thesis, Fachbereich Physik und Elektrotechnik der Universität Bremen, 2016.



2. Knut Müller-Caspary. Applications and limitations of momentum-resolved STEM [Talk at the Meeting of the AK-HREM on High-resolution TEM, TU Berlin, Berlin(Germany)], April 2016.

1. Knut Müller-Caspary. Probing electric fields by STEM [Lecture], June 2015.



2. Knut Müller-Caspary and Andreas Rosenauer. STEM and TEM Simulation [Tutorial], June 2015.

1. Christoph Mahr. Bestimmung von Präzision und Genauigkeit bei Verzerrungsmessungen mittels konvergenter Elektronenbeugung. Master's thesis, Universität Bremen, Otto-Hahn-Allee 1,28359 Bremen, Germany, September 2014.



2. Knut Müller. Evaluation of STEM images with the ImageEval software [Tutorial], January 2014.



3. Knut Müller. Nanowires, quantum wells, MOSFETs: Scanning and conventional TEM characterisation of structure and composition [Invited talk], October 2014.



4. Knut Müller. Practice of quantitative STEM [Lecture], January 2014.



5. Knut Müller. Quantitative analysis of (S)TEM images using the ImageEval software [Tutorial], October 2014.



6. Knut Müller. Simulation of STEM images [Lecture], January 2014.



7. Knut Müller. Simulation of STEM images with the STEMsim software [Tutorial], January 2014.



8. Knut Müller, Thorsten Mehrtens, Florian Krause, Marco Schowalter, and Andreas Rosenauer. Simulation of STEM images [Invited talk], February 2014.



9. Knut Müller and Andreas Rosenauer. Quantitative STEM simulation/Evaluation [Tutorial], September 2014.

1. Moritz Tewes. Quantitative STEM-Untersuchung von Germanium-Silizium-Heterostrukturen (Quantitative STEM investigations of germanium-silicon heterostructures). Master's thesis, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany, February 2013.



2. Knut Müller. Practice and Application of quantitative STEM [Lecture], March 2013.



3. Knut Müller. Strain Analysis by Nano-Beam Electron Diffraction (SANBED) [Lecture], August 2013.



4. Knut Müller and Andreas Rosenauer. Simulation of STEM images with the STEMsim software [Tutorial], March 2013.



5. Knut Müller, Andreas Rosenauer, Marco Schowalter, Josef Zweck, Kerstin Volz, Heike Soltau, Pavel Potapov, and Karl Engl. Strain Analysis by Nano-Beam Electron Diffraction [Invited talk], 2013.

1. Daniel Erben. Verspannungsmessungen in SiGe-basierten Feldeffekttransistoren mittels konvergenter Elektronenbeugung (Strain measurements in SiGe-based field effect transistors using convergent electron diffraction), August 2012.



2. Patrick Karasch. Messung von Verspannungen und piezoelektrischen Feldern in InGaN/GaN Quantentrögen mittels Elektronenbeugung (Measurement of strain and piezoelectric fields in InGaN/GaN quantum wells by electron diffraction), August 2012.



3. Christoph Mahr. Einfluss von Linsenfehlers auf Verspannungsmessungen aus CBED-Bildern im TEM (Impact of lens aberrations on strain measurements from CBED images in a TEM), July 2012.

1. Dennis Zillmann. Bestimmung der Modulationstransferfunktion einer CCD-Kamera und Kontrasttransfer in der Transmissionselektronenmikroskopie (Determination of the modulation transfer function of a CCD camera and contrast transfer in the field of transmission electron microscopy). Master's thesis, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany, October 2011.

1. Thorsten Mehrtens. Bestimmung von Segregationsprofilen in InGaAs/GaAs-Quantentrögen mittels konventioneller und Rastertransmissionselektronenmikroskopie. Master's thesis, Universität Bremen, 2009.



2. Claas Gloistein. Messung von Debye-Waller-Faktoren für Galliumarsenid mittels Elektronenbeugung (Measurement of Debye-Waller-factors for gallium arsenide by electron diffraction), May 2009.



3. Nils Neugebohrn. Quantitative Untersuchung der Temperatur- und Dickenabhängigkeit des STEM-Dunkelfeldsignals von Zinkblende-Halbleitern (Quantitative investigation of the temperature and thickness dependence of the STEM dark field signal of zinc blende semiconductors), July 2009.

1. Knut Müller. Measurement of 002 structure factors for GaAs using parallel and convergent beam electron diffraction [Talk], April 2008.

1. Knut Müller. Bestimmung von Strukturfaktoren für Galliumarsenid mittels Elektronenbeugung - Entwicklung und Test einer Messmethode (Determination of structure factors for gallium arsenide by electron diffraction - development and test of a measurement method). Diplomarbeit, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany, September 2007.

1. Knut Müller. Quantitative Analyse von InGaN-Inseln mittels Hochauflösungs-Transmissionselektronenmikroskopie (Quantitative analysis of InGaN-islands by high-resolution transmission electron microscopy), June 2006.

This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All person copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.

Les documents contenus dans ces répertoires sont rendus disponibles par les auteurs qui y ont contribué en vue d'assurer la diffusion à temps de travaux savants et techniques sur une base non-commerciale. Les droits de copie et autres droits sont gardés par les auteurs et par les détenteurs du copyright, en dépit du fait qu'ils présentent ici leurs travaux sous forme électronique. Les personnes copiant ces informations doivent adhérer aux termes et contraintes couverts par le copyright de chaque auteur. Ces travaux ne peuvent pas être rendus disponibles ailleurs sans la permission explicite du détenteur du copyright.

This document was translated from BibT_EX by bibtex2html