1. A. Pretorius, K. Müller, T. Yamaguchi, R. Kröger, D. Hommel, and A. Rosenauer. Concentration Evaluation in Nanometre-Sized InGaN Islands Using Transmission Electron Microscopy, pages 17--20. Springer Netherlands, 2008.



2. Bernhard Gehl, Andreas Frömsdorf, Vesna Aleksandrovic, Thomas Schmidt, Angelika Pretorius, Jan-Ingo Flege, Sigrid Bernstorff, Andreas Rosenauer, Jens Falta, Horst Weller, and Marcus Bäumer. Structural and Chemical Effects of Plasma Treatment on Close-Packed Colloidal Nanoparticle Layers. Advanced Functional Materials, 18(16):2398--2410, 2008. Keyword(s): Adsorption, GISAXS, Nanoparticle layers, Plasma, XPS.



3. Birte Jürgens, Holger Borchert, Kirsten Ahrenstorf, Patrick Sonström, Angelika Pretorius, Marco Schowalter, Katharina Gries, Volkmar Zielasek, Andreas Rosenauer, Horst Weller, and Marcus Bäumer. Colloidally Prepared Nanoparticles for the Synthesis of Structurally Well-Defined and Highly Active Heterogeneous Catalysts. Angewandte Chemie International Edition, 47(46):8946--8949, 2008. Keyword(s): colloids, heterogeneous catalysis, nanoparticles, oxidation, supported catalysts.



4. D. Litvinov, M. Schowalter, A. Rosenauer, B. Daniel, J. Fallert, W. Löffler, H. Kalt, and M. Hetterich. Determination of critical thickness for defect formation of CdSe/ZnSe heterostructures by transmission electron microscopy and photoluminescence spectroscopy. physica status solidi (a), 205(12):2892--2897, 2008. Keyword(s): 68.37.Lp, 68.37.Og, 68.55.ag, 68.65.Fg, 78.55.Et.



5. J. Pizarro, P.L. Galindo, E. Guerrero, A. Yanez, M. P. Guerrero, A. Rosenauer, D. L. Sales, and S.I. Molina. Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures. Applied Physics Letters, 93(15):153107--153107-3, 2008. Keyword(s): indium compounds, nanowires, scanning electron microscopy, semiconductor quantum wires, 6146Km, 6837Hk, 6865La.



6. Andreas Rosenauer, Marco Schowalter, John T. Titantah, and Dirk Lamoen. An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy. Ultramicroscopy, 108(12):1504--1513, 2008. Keyword(s): Thermal diffuse scattering.



7. J. T. Titantah, D. Lamoen, M. Schowalter, and A. Rosenauer. Size effects and strain state of Ga(1-x)In(x)As/GaAs multiple quantum wells: Monte Carlo study. Phys. Rev. B, 78:165326, October 2008.

1. T. Aschenbrenner, S. Figge, D. Hommel, M. Schowalter, and A. Rosenauer. MOVPE-growth of a-plane InGaN quantum wells on GaN buffer layers on r-plane sapphire substrates. In IC-MOVPE, 1.-6. June 2008, 2008.



2. H. Dartsch, S. Figge, T. Aschenbrenner, A. Pretorius, A. Rosenauer, and D. Hommel. Strain compensated AlGaN/GaN-Bragg-reflectors with high Al content grown by MOVPE. In IC-MOVPE, 1.-6. June 2008, 2008.



3. P. Galindo, J. Pizarro, A. Rosenauer, A. Yanez, E. Guerrero, and S. Molina. HAADF-STEM image simulation of large scale nanostructures. In M. Luysberg, K. Tillmann, T. Weirich (Eds.): EMC 2008, Instrumentation and Methods, volume 1, pages 111--112, 2008.



4. K. Gries, R. Kröger, C. Kuebel, M. Fritz, and A. Rosenauer. Electron microscopic investigations of the polymer/mineral composite material nacre. In S. Richter, A. Schwedt (Eds.): EMC 2008, Vol. 2: Materials Science, pp. 733-734, DOI: 10.1007/978-3-540-85226-1_367, 2008.



5. Katharina Gries, Roland Kröger, Christian Kuebel, Monika Fritz, and Andreas Rosenauer. Elektronenmikroskopische Untersuchung des Polymer-Mineral-Verbundmaterials Perlmutt. In DPG Frühjahrstagung, Berlin (Germany), 2008.



6. M. Monville, S. Bonnany, M. Schowalter, C. Birgot, B. Lombardet, and C. Belouet. Proceedings of Carbon conference. In , 2008.



7. Knut Müller and Katharina Gries. Advanced Methods in Transmission Electron Microscopy. In Tutorial held at the workshop of the Institute for solid state physics in Riezlern, Austria. A handout of the 30 minutes talk is available at http://www.ifp.uni-bremen.de, 2008.



8. Knut Müller, Marco Schowalter, Andreas Rosenauer, Jacob Jansen, John Titantah, and Dirk Lamoen. Measurement of 002 structure factors for GaAs from electron spot diffraction patterns. In Verhandlungen der DPG [Talk], number HL 33.2, pages 376, 2008.



9. Knut Müller, Marco Schowalter, Andreas Rosenauer, Dirk Lamoen, John Titantah, Jacob Jansen, and Kenji Tsuda. Measurement of GaAs structure factors from the diffraction of parallel and convergent electron nanoprobes. In M. Luysberg, K. Tillmann, and T. Weirich, editors, EMC 2008, Vol. 1: Instrumentation and methods [Poster], pages 215--216, 2008.



10. Knut Müller, Marco Schowalter, Andreas Rosenauer, John Titantah, Dirk Lamoen, Jacob Jansen, and Kenji Tsuda. Measurement of 002 structure factors for GaAs using parallel and convergent beam electron diffraction. In Meeting of the Arbeitskreises Hochauflösende Elektronenmikroskopie der Deutschen Gesellschaft für Elektronenmikroskopie, Bremen [Vortrag (Talk)], 2008.



11. A. Pretorius, T. Aschenbrenner, H. Dartsch, S. Figge, D. Hommel, and A. Rosenauer. Transmission electron microscopical investigation of AlGaN/GaN distributed Bragg reflectors. In IWN 2008, 6-10 Oktober, Montreaux, Schweiz Physica Status Solidi C 6, S680-S683, 2008.



12. A. Pretorius, A. Rosenauer, T. Aschenbrenner, H. Dartsch, S. Figge, and D. Hommel. TEM analyses of microstructure and composition of Al(x)Ga(1-x)N/GaN distributed Bragg reflectors. In S. Richter, A. Schwedt (Eds.): EMC 2008, Vol. 2: Materials Science, pp. 81-82, DOI: 10.1007/978-3-540-85226-1_41, 2008.



13. A. Rosenauer, M. Schowalter, J. Titantah, and D. Lamoen. A novel emission potential multislice method to calculate intensity contributions for thermal diffuse scattering in plane wave illumination TEM. In M. Luysberg, K. Tillmann, T. Weirich (Eds.): EMC 2008, Vol. 1: Instrumentation and Methods, pp. 147-148, DOI: 10.1007/978-3-540-85156-1_74, 2008.



14. M. Schowalter, A. Rosenauer, J. Titantah, and D. Lamoen. Computation and parametrization of Debye-Waller temperature factors for sphalerite type II-VI, III-V and group IV semiconductors. In M. Luysberg, K. Tillmann, T. Weirich (Eds.): EMC 2008, Vol. 1: Instrumentation and Methods, pp. 153-154, DOI: 10.1007/978-3-540-85156-1_77, 2008.

1. Knut Müller. Measurement of 002 structure factors for GaAs using parallel and convergent beam electron diffraction [Talk], April 2008.

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