1. H. Kauko, T. Grieb, R. Bjørge, M. Schowalter, A.M. Munshi, H. Weman, A. Rosenauer, and A.T.J. van Helvoort. Compositional characterization of GaAs/GaAsSb nanowires by quantitative HAADF-STEM. Micron, 44(0):254-260, 2013. ISSN: 0968-4328. [WWW] [doi:10.1016/j.micron.2012.07.002] Keyword(s): HAADF-STEM.



2. Andreas Rosenauer, Thorsten Mehrtens, Knut Müller, Katharina Gries, Marco Schowalter, Stephanie Bley, Parlapalli Venkata Satyam, Adrian Avramescu, Karl Engl, and Stephan Lutgen. 2D-composition mapping in InGaN without electron beam induced clustering of indium by STEM HAADF Z-contrast imaging. Journal of Physics: Conference Series, 326(1):012040, 2011. [WWW]



3. A. Rosenauer, M. Schowalter, F. Glas, and D. Lamoen. First-principles calculations of 002 structure factors for electron scattering in strained In(x)Ga(1-x)As. Phys. Rev. B, 72:085326, August 2005. [doi:10.1103/PhysRevB.72.085326] Keyword(s): structure factor, strain, InGaAs, In, Ga, As, first-principles calculation, electron scattering.



4. A Rosenauer, D Van Dyck, M Arzberger, and G Abstreiter. Compositional analysis based on electron holography and a chemically sensitive reflection. Ultramicroscopy, 88(1):51-61, 2001. ISSN: 0304-3991. [WWW] [doi:10.1016/S0304-3991(00)00115-7] Keyword(s): Compositional analysis.



5. A. Rosenauer and D. Gerthsen. Composition evaluation by the lattice fringe analysis method using defocus series. Ultramicroscopy, 76(1):49-60, 1999.



6. A. Rosenauer, U. Fischer, D. Gerthsen, and A. Förster. Composition evaluation by lattice fringe analysis. Ultramicroscopy, 72:121-133, 1998. [doi:10.1016/S0304-3991(98)00002-3]

1. P. V. Satyam, A. Rosenauer, J. Dash, A. Rath, J. Raghava, M. Schowalter, Tim Grieb, K. M�ller, T. Mehrtens, and Robert Imlau. Compositional analysis of nanostructures with STEM Z-contrast imaging. In EM50, Hyderabad (India) [Talk], 2011.



2. A. Rosenauer, D. Gerthsen, D. Van Dyck, M. Arzberger, G. Böhm, and G. Abstreiter. Compositional analysis of semiconductor nanostructures based on electron holography and a chemically sensitive reflection. In International Conference on Electron Microscopy (ICEM) 15, Durban, 1-6 September 2002, p. 291, 2002.



3. A. Rosenauer, D. Gerthsen, D. Van Dyck, M. Arzberger, G. Böhm, and G. Abstreiter. Compositional analysis based upon electron holography and a chemically sensitive reflection, (invited talk). In Microcopy of Semiconducting Materials 2001, Oxford, UK, 25-29 March 2001, Inst. Phys. Conf. Ser. 169, 33-36 Proceedings of the Royal Microscopical Society Conference, Editors A.G. Cullis, J.L. Hutchison, Institute of Physics Publishing (2001), 2001.

This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All person copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.

Les documents contenus dans ces répertoires sont rendus disponibles par les auteurs qui y ont contribué en vue d'assurer la diffusion à temps de travaux savants et techniques sur une base non-commerciale. Les droits de copie et autres droits sont gardés par les auteurs et par les détenteurs du copyright, en dépit du fait qu'ils présentent ici leurs travaux sous forme électronique. Les personnes copiant ces informations doivent adhérer aux termes et contraintes couverts par le copyright de chaque auteur. Ces travaux ne peuvent pas être rendus disponibles ailleurs sans la permission explicite du détenteur du copyright.

This document was translated from BibT_EX by bibtex2html