List of publications: index
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2016 2015 2014 2013 2012 2011 2010 2009 2008
2007 2006 2005 2004 2003 2002 2001 2000 1999
1998 1997 1996 1995 1994 1993 1992 no year

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Books and proceedings Thesis Articles in journal, book chapters
Conference articles Miscellaneous

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A B C D E F G H I J K L M N
O P Q R S T U V W X Y Z

F Kristian Frank
G Tim Grieb Katharina Gries
K Florian Krause
M Christoph Mahr Thorsten Mehrtens Knut Müller-Caspary
Knut Müller
P Angelika Pretorius
R Andreas Rosenauer
S Marco Schowalter

Selection by keyword

A B C D E F G H I J K L M N
O P Q R S T U V W X Y Z

4 4240Lx 4255Px 4255Sa
4260By 42.79.Fm
6 6143Bn 6143Er 6146Km
6146+w 6172Ff 6172Vv
64.75 +g 64.75.+g 66.30.Xj
6835Bs 6835Dv 6835Gy
6837Hk 6837Lp 68.37.Og
68.55.ag 6855Ln 68.55.Nq
68.65.-k 68.65.Cd 6865Fg
6865+g 6865Hb 6865La
7 7135-y 71.72.Ff 7361Ey
7361Ga 7855Cr 7855Et
7866Hf 7867De
8 81.05 Ea 8105Dz 81.05.Ea
8107St 8107Ta 8115Gh
8115Hi 83.85.St 8530Vw
A A1. Biocrystallization A1. Characterization A1. Desorption
A1. Electroluminescence A1. High resolution transmission electron microscopy A1. Metalorganic vapor phase epitaxy
A1. Segregation A1. Surface processes A1. Transmission electron microscopy
A1. X-ray diffraction A3. Laser epitaxy A3. Low press. metalorganic vapor phase epitaxy
A3. Metalorganic vapor phase epitaxy A3. Migration enhanced epitaxy A3. Molecular beam epitaxy
A3. Quantum wells ab initio calculations aberrations
Adsorption Al AlAs
aluminium compounds annealing Annular bright-field imaging
Anodic etching antimony APW calculations
Argon ion milling arsenic compounds ARSTEM
As atomic force microscopy
B B1. Nitrides B2. Semiconducting III-V materials B3. Sensors
band structure biexcitons bond lengths
Bonding BURGERS VECTOR buried layers
C cadmium compounds CADMIUM SELENIDES carbon
CCD CCD image sensors CdSe/(Zn
chemical analysis chemical interdiffusion Chemie und Materialwissenschaften
colloids Composition determination Compositional analysis
Convergent beam electron diffraction correction factor crystal binding
Crystals
D Debye-Waller factors defect states defects
density functional theory direct electron detection DISLOCATIONS
distributed Bragg reflectors dopants DOPED MATERIALS
doping DPC
E Efficiency droop EFTEM elastic constants
electric field electric fields electric potential
electroluminescence electron beam effects electron detection
electron energy loss spectra electron holography Electron microscopy
electron probes electron scattering elemental semiconductors
EPITAXIAL LAYERS excitonic localization excitons
Experimental study extinction coefficients
F fast field emission electron microscopy finite element analysis
first-principles calculation Flame spray pyrolysis fluctuations
Fluorescence labeling Focused ion beam force constants
Frozen lattice simulation
G Ga GaAs gain
gallium arsenide GALLIUM ARSENIDES gallium compounds
GaN GAN ULTRATHIN MEMBRANES GaSb
GISAXS gold growth
H HAADF HAADF-STEM HAADF STEM tomography
heterogeneous catalysis HETEROSTRUCTURES high-frequency effects
High-resolution methods high-speed optical techniques
I II-VI semiconductors III-V semiconductors Image simulation
IMFP impurity distribution In
InAs InAs/AlAs indium compounds
InGaAs InGaN/GaN interface states
interface structure internal stresses iris
iron island structure
L laser diodes lasers Lasing
lattice constants Layer thickness light emitting diodes
Low-energy ion milling
M magnesium compounds MBE mean inner Coulomb potential
Mean inner potential mean-square displacements Measuring methods
melting point metallic thin films Mg)(S
microcavities microcavity lasers mip
MISFIT DISLOCATIONS MOCVD MOCVD coatings
modified atomic scattering amplitudes molecular beam epitaxial growth MOLECULAR BEAM EPITAXY
monolayers Monte Carlo methods Morphology
MOVPE MQW Multislice simulation
N N Nacre nano-beam electron diffraction
nanofabrication Nanoparticle layers nanoparticles
nanorods NANOSTRUCTURE FABRICATION nanostructured materials
nanowires NBD nitrides
noncrystalline structure notpeer nucleation
O optical properties optimised imaging conditions optimized imaging conditions
oxidation
P Parallel beam electron diffraction Phase plate phonon densities of states
phonon density of states phonon dispersion relations phonon spectra
photoelectron microscopy Photoemission microscopy photoluminescence
PHOTONIC CRYSTALS picodiffraction piezoelectric
Plasma plastic deformation PLASTICITY
pnccd polarisation polarization
Polysiloxane Praseodymium oxide
Q QCSE quantification Quantitative
Quantitative STEM Quantitative STEM Z-contrast imaging quantum confined Stark effect
quantum dots quantum-well quantum well lasers
quantum wells
R red shift reflection high energy electron diffraction refractive index
resonant waveguiding RHEED Rutherford backscattering
S S7.12 S7.14 S8.13
SANBED Sb scanning electron microscopy
scanning-transmission electron microscopy scanning tunneling microscopy scattering factors
Se) segregation self-assembly
semiconductor semiconductor doping semiconductor epitaxial layers
semiconductor growth semiconductor heterojunctions semiconductor materials
semiconductor quantum dots semiconductor quantum wells semiconductor quantum wires
semiconductor superlattices semiconductors Silica
silicon silicon compounds slabs
spectral line breadth spectral line intensity sphalerite
Spray deposition Spray forming stacking faults
Stark effect static atomic displacements STEM
stimulated emission Stobbs factor stoichiometry
Stopping and range of ions in matter strain Strain measurement
strain state Stress analysis STRESS RELAXATION
structure factor Structure factor refinement submonolayer
supported catalysts Surface functionalization surface morphology
surface potential surface roughness surface segregation
surface structure
T TEM THEORY AND DESIGN Thermal diffuse scattering
transmission electron microscopy
U ultrafast
V vacuum deposition vapour phase epitaxial growth vertical correlation
Virus-material interaction VPE
W wide band gap semiconductors
X X-ray diffraction X-ray photoemission spectroscopy X-ray standing waves
XPS
Z zinc compounds zinc oxide ZINC SELENIDES

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Last modified: Wed Sep 21 12:45:13 2016
Author: knut.


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