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Publications about 'distributed Bragg reflectors'
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Articles in journal, book chapters
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Carsten Kruse,
Wojciech Pacuski,
Tomasz Jakubczyk,
Jakub Kobak,
Jan A Gaj,
Kristian Frank,
Marco Schowalter,
Andreas Rosenauer,
Matthias Florian,
Frank Jahnke,
and Detlef Hommel.
Monolithic ZnTe-based pillar microcavities containing CdTe quantum dots.
Nanotechnology,
22(28):285204,
2011.
[WWW]
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Angelika Pretorius,
Thomas Schmidt,
Timo Aschenbrenner,
Tomohiro Yamaguchi,
Christian Kübel,
Knut Müller,
Heiko Dartsch,
Detlef Hommel,
Jens Falta,
and Andreas Rosenauer.
Microstructural and compositional analyses of GaN based nanostructures.
Physica Status Solidi,
248:1822-1836,
2011.
[doi:10.1002/pssb.201147175]
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T. Aschenbrenner,
H. Dartsch,
C. Kruse,
M. Anastasescu,
M. Stoica,
M. Gartner,
A. Pretorius,
A. Rosenauer,
Thomas Wagner,
and D. Hommel.
Optical and structural characterization of AlInN layers for optoelectronic applications.
J. Appl. Phys.,
108(6):063533,
2010.
[WWW]
[doi:10.1063/1.3467964]
Keyword(s): aluminium compounds,
annealing,
distributed Bragg reflectors,
extinction coefficients,
III-V semiconductors,
indium compounds,
MOCVD coatings,
refractive index,
semiconductor epitaxial layers,
surface morphology,
surface roughness,
transmission electron microscopy,
vapour phase epitaxial growth,
wide band gap semiconductors,
X-ray diffraction.
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R. Kröger,
C. Kruse,
C. Roder,
D. Hommel,
and A. Rosenauer.
Relaxation in crack-free AlN/GaN superlattices.
physica status solidi (b),
243(7):1533-1536,
2006.
ISSN: 1521-3951.
[doi:10.1002/pssb.200565470]
Keyword(s): 42.79.Fm,
68.37.Lp,
68.55.Ln,
68.65.Cd,
71.72.Ff,
83.85.St.
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M. Schowalter,
M. Tewes,
K. Frank,
R. Imlau,
A. Rosenauer,
H.S. Lee,
O.G. Rastelli,
M. Schmidt,
M. Tavast,
T. Leinonen,
and M. Guina.
Investigation of diffusion in AlAs/GaAs distributed Bragg reflectors using HAADF STEM imaging.
In MSM 2011 Cambridge, U.K. [poster] poster P2.12,
2011.
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A. Pretorius,
T. Aschenbrenner,
H. Dartsch,
S. Figge,
D. Hommel,
and A. Rosenauer.
Transmission electron microscopical investigation of AlGaN/GaN distributed Bragg reflectors.
In IWN 2008, 6-10 Oktober, Montreaux, Schweiz Physica Status Solidi C 6, S680-S683,
2008.
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A. Pretorius,
A. Rosenauer,
T. Aschenbrenner,
H. Dartsch,
S. Figge,
and D. Hommel.
TEM analyses of microstructure and composition of Al(x)Ga(1-x)N/GaN distributed Bragg reflectors.
In S. Richter, A. Schwedt (Eds.): EMC 2008, Vol. 2: Materials Science, pp. 81-82, DOI: 10.1007/978-3-540-85226-1_41,
2008.
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Last modified: Wed Sep 21 12:45:10 2016
Author: knut.
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