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Publications about 'lattice constants'
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Articles in journal, book chapters
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Stephan Figge,
Timo Aschenbrenner,
Carsten Kruse,
Gerd Kunert,
Marco Schowalter,
Andreas Rosenauer,
and Detlef Hommel.
A structural investigation of highly ordered catalyst- and mask-free GaN nanorods.
Nanotechnology,
22(2):025603,
2011.
[WWW]
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J. T. Titantah,
D. Lamoen,
M. Schowalter,
and A. Rosenauer.
Modified atomic scattering amplitudes and size effects on the 002 and 220 electron structure factors of multiple Ga$_{1-x}$In$_x$As/GaAs quantum wells.
J. Appl. Phys.,
105(8):084310,
2009.
[WWW]
[doi:10.1063/1.3115407]
Keyword(s): arsenic compounds,
density functional theory,
gallium arsenide,
gallium compounds,
III-V semiconductors,
indium compounds,
lattice constants,
Monte Carlo methods,
nanostructured materials,
semiconductor heterojunctions,
semiconductor quantum wells.
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D. Gerthsen,
B. Neubauer,
A. Rosenauer,
T. Stephan,
H. Kalt,
O. Schon,
and M. Heuken.
InGaN composition and growth rate during the early stages of metalorganic chemical vapor deposition.
Applied Physics Letters,
79(16):2552-2554,
2001.
ISSN: 0003-6951.
[doi:10.1063/1.1409949]
Keyword(s): III-V semiconductors,
MOCVD,
gallium compounds,
indium compounds,
lattice constants,
photoluminescence,
red shift,
semiconductor growth,
semiconductor quantum wells,
spectral line intensity,
transmission electron microscopy,
wide band gap semiconductors,
6865Fg,
7855Cr,
7867De,
8107St,
8115Gh.
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B. Neubauer,
A. Rosenauer,
D. Gerthsen,
O. Ambacher,
and M. Stutzmann.
Analysis of composition fluctuations on an atomic scale in Al(0.25)Ga(0.75)N by high-resolution transmission electron microscopy.
Applied Physics Letters,
73(7):930-932,
1998.
[WWW]
[doi:10.1063/1.122041]
Keyword(s): aluminium compounds,
gallium compounds,
wide band gap semiconductors,
III-V semiconductors,
stoichiometry,
fluctuations,
transmission electron microscopy,
lattice constants,
semiconductor heterojunctions,
interface structure,
semiconductor epitaxial layers.
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A. Rosenauer,
U. Fischer,
D. Gerthsen,
and A. Forster.
Composition evaluation of In(x)Ga(1-x)As Stranski-Krastanow-island structures by strain state analysis.
Applied Physics Letters,
71(26):3868-3870,
1997.
[WWW]
[doi:10.1063/1.120528]
Keyword(s): indium compounds,
gallium arsenide,
III-V semiconductors,
island structure,
transmission electron microscopy,
lattice constants,
molecular beam epitaxial growth,
semiconductor epitaxial layers,
finite element analysis,
segregation,
semiconductor growth.
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S. Bauer,
A. Rosenauer,
P. Link,
W. Kuhn,
J. Zweck,
and W. Gebhardt.
Misfit dislocations in epitaxial ZnTe/GaAs (001) studied by {HRTEM}.
Ultramicroscopy,
51(1-4):221-227,
1993.
ISSN: 0304-3991.
[WWW]
[doi:10.1016/0304-3991(93)90148-Q]
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Last modified: Wed Sep 21 12:45:11 2016
Author: knut.
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