BACK TO INDEX
Publications about 'nano-beam electron diffraction'
|
Articles in journal, book chapters
|
-
Daniel Carvalho,
Knut Müller-Caspary,
Marco Schowalter,
Tim Grieb,
Thorsten Mehrtens,
Andreas Rosenauer,
Rafael Ben, Teresa Garcìa,
Andrés Redondo-Cubero,
Katharina Lorenz,
Bruno Daudin,
and Francisco M. Morales.
Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction.
Scientific Reports,
6:28459,
June 2016.
[doi:10.1038/srep28459]
Keyword(s): DPC,
strain,
NBD,
SANBED,
nano-beam electron diffraction,
polarization,
polarisation,
piezoelectric.
-
C. Mahr,
K. Müller-Caspary,
T. Grieb,
M. Schowalter,
T. Mehrtens,
F.F. Krause,
D. Zillmann,
and A. Rosenauer.
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction.
Ultramicroscopy,
158(0):38-48,
2015.
ISSN: 0304-3991.
[WWW]
[doi:10.1016/j.ultramic.2015.06.011]
Keyword(s): Strain measurement.
-
K Müller,
H Ryll,
I Ordavo,
M Schowalter,
J Zweck,
H Soltau,
S Ihle,
L Strüder,
K Volz,
P Potapov,
and A Rosenauer.
STEM strain analysis at sub-nanometre scale using millisecond frames from a direct electron read-out CCD camera.
Journal of Physics: Conference Series,
471(1):012024,
2013.
[WWW]
-
C. Mahr,
K. Müller-Caspary,
T. Grieb,
F. F. Krause,
M. Schowalter,
A. Lackmann,
A. Wittstock,
and A. Rosenauer.
Measurement of strain in nanoporous gold using nano-beam electron diffraction.
In European Microscopy Congress 2016 (EMC 2016), Lyon (F), [Poster IM06-352],
2016.
-
C. Mahr,
K. Müller-Caspary,
A. Oelsner,
A. Rosenauer,
and P. Potapov.
STEM strain measurement from a stream of diffraction patterns recorded on a pixel-free delay-line detector [Talk].
In EMAG conference 2016, Durham, UK,
2016.
-
Knut Müller-Caspary,
Thorsten Mehrtens,
Marco Schowalter,
Tim Grieb,
Andreas Rosenauer,
Florian F. Krause,
Christoph Mahr,
and Pavel Potapov.
ImageEval. A software for the processing, evaluation and acquisition of (S)TEM images.
In European Microscopy Congress 2016, Lyon (F), [Poster IM03-286],
2016.
[doi:10.1002/EMC2016.0677]
-
Knut Müller-Caspary,
Andreas Oelsner,
and Pavel Potapov.
STEM Strain Measurement From a Stream of Diffraction Patterns Recorded on a Pixel-Free Delay-Line Detector.
In Microscopy and Microanalysis 2016, Columbus (OH/USA), [Poster],
July 24-28th 2016.
-
Knut Müller-Caspary,
Andreas Oelsner,
Pavel Potapov,
and Thomas Schmidt.
Analysis of strain and composition in GeSi/Si heterostructures by electron microscopy.
In European Microscopy Congress 2016, Lyon (F), [Talk MS03-OP239],
2016.
[doi:10.1002/EMC2016.0311]
-
T. Grieb,
D. Carvalho,
K. Müller-Caspary,
M. Schowalter,
C. Mahr,
A. Beyer,
A. Hyra,
T. Ben,
F. M. Morales,
R. Garcia,
K. Volz,
B. Daudin,
and A. Rosenauer.
Quantitative nano-beam electron diffraction: Measuring strain and electric fields.
In Microscopy Conference MC 2015, Göttingen (D), Session IM 2 [Talk],
September 6-11th 2015.
-
C. Mahr,
K. Müller,
M. Schowalter,
T. Mehrtens,
T. Grieb,
F.F. Krause,
D. Erben,
and A. Rosenauer.
Analysis and improvement of precision and accuracy of strain measurements by convergent nano-beam electron diffraction (SANBED).
In Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK) [Talk],
volume Session 3b, Tue, March 31st,
2015.
-
C. Mahr,
K. Müller-Caspary,
T. Grieb,
T. Mehrtens,
M. Schowalter,
F. F. Krause,
D. Zillmann,
and A. Rosenauer.
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction (SANBED).
In Microscopy Conference MC 2015, Göttingen (D), session MS 2, [Poster MS2.P023],
September 6-11th 2015.
-
Knut Müller,
Andreas Oelsner,
Andreas Rosenauer,
and Pavel Potapov.
STEM strain measurement from a stream of diffraction patterns recorded on a pixel-free delay-line detector.
In Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK) [Poster],
volume Poster Session 2, Poster P 2.5 (Tue, March 31st),
2015.
-
C. Mahr,
K. Müller,
D. Erben,
M. Schowalter,
J. Zweck,
K. Volz,
and A. Rosenauer.
Strain Analysis by Nano-Beam Electron Diffraction (SANBED) in semiconductor nanostructures.
In 18th International Microscopy Congress (IMC) [Poster IT-9-P-3029],
2014.
-
K. Müller,
H. Ryll,
I. Ordavo,
S. Ihle,
M. Huth,
M. Simson,
J. Zweck,
K. Volz,
H. Soltau,
P. Potapov,
L. Strüder,
M. Schowalter,
C. Mahr,
D. Erben,
and A. Rosenauer.
Strain Analyisis by Nano-Beam Electron Diffraction using millisecond frames of a direct electron pnCCD detector.
In 18th International Microscopy Congress (IMC) [Talk MS-8-O-3268],
2014.
-
Knut Müller,
Henning Ryll,
Ivan Ordavo,
Sebastian Ihle,
Martin Huth,
Martin Simson,
Josef Zweck,
Kerstin Volz,
Heike Soltau,
Andreas Rosenauer,
Pavel Potapov,
Marco Schowalter,
Lothar Strüder,
Christoph Mahr,
and Daniel Erben.
Strain Analysis from Nano-beam Electron Diffraction Patterns Recorded on Direct Electron Charge-coupled Devices.
In Microscience Microscopy Congress, MMC 2014, Manchester (UK), July, 2014 [invited talk PS3.1.4],
2014.
-
K. Müller,
H. Ryll,
I. Ordavo,
D. Zillmann,
M. Schowalter,
J. Zweck,
H. Soltau,
S. Ihle,
L. Strüder,
K. Volz,
P. Potapov,
and A. Rosenauer.
Strain Analysis by Nano-Beam Electron Diffraction (SANBED): Present performance and future prospects.
In Proceedings of the Microscopy Conference 2013 (MC 2013, Regensburg) Germany [Talk],
volume 1: Instrumentation and Methods,
pages IM.1.004,
2013.
-
Knut Müller,
Andreas Rosenauer,
Marco Schowalter,
Josef Zweck,
Rafael Fritz,
and Kerstin Volz.
Strain analysis by nano-beam electron diffraction (SANBED) in semiconductor nanostructures [Invited talk].
In The XXXIII Annual Meeting of the Electron Microscopy Society of India,
pages 36,
2012.
Keyword(s): SANBED.
-
Knut Müller.
Strain Analysis by Nano-Beam Electron Diffraction (SANBED) [Lecture],
August 2013.
-
Knut Müller,
Andreas Rosenauer,
Marco Schowalter,
Josef Zweck,
Kerstin Volz,
Heike Soltau,
Pavel Potapov,
and Karl Engl.
Strain Analysis by Nano-Beam Electron Diffraction [Invited talk],
2013.
BACK TO INDEX
Disclaimer:
This material is presented to ensure timely dissemination of
scholarly and technical work. Copyright and all rights therein
are retained by authors or by other copyright holders.
All person copying this information are expected to adhere to
the terms and constraints invoked by each author's copyright.
In most cases, these works may not be reposted
without the explicit permission of the copyright holder.
Les documents contenus dans ces répertoires sont rendus disponibles
par les auteurs qui y ont contribué en vue d'assurer la diffusion
à temps de travaux savants et techniques sur une base non-commerciale.
Les droits de copie et autres droits sont gardés par les auteurs
et par les détenteurs du copyright, en dépit du fait qu'ils présentent
ici leurs travaux sous forme électronique. Les personnes copiant ces
informations doivent adhérer aux termes et contraintes couverts par
le copyright de chaque auteur. Ces travaux ne peuvent pas être
rendus disponibles ailleurs sans la permission explicite du détenteur
du copyright.
Last modified: Wed Sep 21 12:45:11 2016
Author: knut.
This document was translated from BibTEX by
bibtex2html