1. Thorsten Mehrtens. Quantitative STEM an indiumhaltigen Gruppe III-V Halbleiternanostrukturen. PhD thesis, Universität Bremen, 2013.

1. Florian. F. Krause. Stemming Unwanted Interference: Resolution Improvement by Incoherent Imaging with ISTEM. Imaging & Microscopy, 18(2):40-43, 2016. Keyword(s): notpeer.



2. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Effects of instrument imperfections on quantitative scanning transmission electron microscopy. Ultramicroscopy, 161:146-160, 2016. ISSN: 0304-3991. [WWW] [doi:10.1016/j.ultramic.2015.10.026] Keyword(s): TEM.



3. Matthias Lohr, Ralph Schregle, Michael Jetter, Clemens Wächter, Knut Müller-Caspary, Thorsten Mehrtens, Andreas Rosenauer, Ines Pietzonka, Martin Strassburg, and Josef Zweck. Quantitative measurements of internal electric fields with differential phase contrast microscopy on InGaN/GaN quantum well structures. physica status solidi (b), 253:140-144, 2016. ISSN: 1521-3951. [doi:10.1002/pssb.201552288] Keyword(s): DPC, Efficiency droop, EFTEM, electric fields, GaN, HAADF, IMFP, MQW, QCSE, quantification, STEM.



4. Knut Müller-Caspary, Florian F. Krause, Tim Grieb, Stefan Löffler, Marco Schowalter, Armand Béché, Vincent Galioit, Dennis Marquardt, Josef Zweck, Peter Schattschneider, Johan Verbeeck, and Andreas Rosenauer. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy. Ultramicroscopy, (in print), 2016. ISSN: 0304-3991. [WWW] [doi:10.1016/j.ultramic.2016.05.004] Keyword(s): TEM.



5. H. Ryll, M. Simson, R. Hartmann, P. Holl, M. Huth, S. Ihle, Y. Kondo, P. Kotula, A. Liebel, K. Müller-Caspary, A. Rosenauer, R. Sagawa, J. Schmidt, H. Soltau, and L. Strüder. A pnCCD-based, fast direct single electron imaging camera for TEM and STEM. Journal of Instrumentation, 11(04):P04006, 2016. [WWW]



6. Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F. Krause, Andreas Rosenauer, and van Aken Peter. Sample tilt effects on atom column position determination in ABF-STEM imaging. Ultramicroscopy, 160:110-117, 2016. ISSN: 0304-3991. [WWW] [doi:10.1016/j.ultramic.2015.10.008] Keyword(s): Annular bright-field imaging.



7. Florian F. Krause, Jan-Philipp Ahl, Darius Tytko, Pyuck-Pa Choi, Ricardo Egoavil, Marco Schowalter, Thorsten Mehrtens, Knut Müller-Caspary, Johan Verbeeck, Dierk Raabe, Joachim Hertkorn, Karl Engl, and Andreas Rosenauer. Homogeneity and composition of AlInGaN: A multiprobe nanostructure study. Ultramicroscopy, 156(0):29-36, 2015. ISSN: 0304-3991. [WWW] [doi:10.1016/j.ultramic.2015.04.012] Keyword(s): HAADF STEM.



8. Knut Müller-Caspary. Messung atomarer elektrischer Felder. Physik in unserer Zeit, 46(3):110-111, 2015. ISSN: 1521-3943. [doi:10.1002/piuz.201590043]



9. Knut Müller-Caspary, Andreas Oelsner, and Pavel Potapov. Two-dimensional strain mapping in semiconductors by nano-beam electron diffracion employing a delay-line detector. Applied Physics Letters, 107:072110, 2015. [doi:10.1063/1.4927837]



10. Tim Grieb, Knut Müller, Emmanuel Cadel, Andreas Beyer, Marco Schowalter, Etienne Talbot, Kerstin Volz, and Andreas Rosenauer. Simultaneous Quantification of Indium and Nitrogen Concentration in InGaNAs Using HAADF-STEM. Microscopy and Microanalysis, 20:1740, 9 2014. ISSN: 1435-8115. [WWW] [doi:10.1017/S1431927614013051]



11. H. Kauko, B. O. Fimland, T. Grieb, A. M. Munshi, K. Müller, A. Rosenauer, and A. T. J. van Helvoort. Near-surface depletion of antimony during the growth of GaAsSb and GaAs/GaAsSb nanowires. Journal of Applied Physics, 116(14):144303, 2014. [doi:10.1063/1.4896904]



12. Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction. Nature Communications, 5:5653:1-8, December 2014. [doi:10.1038/ncomms6653] Keyword(s): DPC, STEM, electric field.



13. Andreas Rosenauer, Florian F. Krause, Knut Müller, Marco Schowalter, and Thorsten Mehrtens. Conventional Transmission Electron Microscopy Imaging beyond the Diffraction and Information Limits. Phys. Rev. Lett., 113:096101, August 2014. [doi:10.1103/PhysRevLett.113.096101]



14. Marco Schowalter, Ingo Stoffers, Florian F. Krause, Thorsten Mehrtens, Knut Müller, Malte Fandrich, Timo Aschenbrenner, Detlef Hommel, and Andreas Rosenauer. Influence of Static Atomic Displacements on Composition Quantification of AlGaN/GaN Heterostructures from HAADF-STEM Images. Microscopy and Microanalysis, 20:1463-1470, 10 2014. ISSN: 1435-8115. [doi:10.1017/S1431927614012732]



15. Duggi V. Sridhara Rao, Ramachandran Sankarasubramanian, Kuttanellore Muraleedharan, Thorsten Mehrtens, Andreas Rosenauer, and Dipankar Banerjee. Quantitative Strain and Compositional Studies of InGaAs Epilayer in a GaAs-based pHEMT Device Structure by TEM Techniques. Microscopy and Microanalysis, 20:1262-1270, 8 2014. ISSN: 1435-8115. [WWW] [doi:10.1017/S1431927614000762]



16. Tim Grieb, Knut Müller, Rafael Fritz, Vincenzo Grillo, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. Quantitative chemical evaluation of dilute GaNAs using ADF STEM: Avoiding surface strain induced artifacts. Ultramicroscopy, 129(0):1-9, 2013. ISSN: 0304-3991. [WWW] [doi:10.1016/j.ultramic.2013.02.006] Keyword(s): Quantitative.



17. L. Hoffmann, H. Bremers, H. Jönen, U. Rossow, M. Schowalter, T. Mehrtens, A Rosenauer, and A. Hangleiter. Atomics scale investigations of ultra-thin GaInN/GaN quantum wells with high indium content. Applied Physics Letters, 102:102110, 2013. [doi:10.1063/1.4795623]



18. H. Kauko, T. Grieb, R. Bjørge, M. Schowalter, A.M. Munshi, H. Weman, A. Rosenauer, and A.T.J. van Helvoort. Compositional characterization of GaAs/GaAsSb nanowires by quantitative HAADF-STEM. Micron, 44(0):254-260, 2013. ISSN: 0968-4328. [WWW] [doi:10.1016/j.micron.2012.07.002] Keyword(s): HAADF-STEM.



19. Thorsten Mehrtens, Knut Müller, Marco Schowalter, Dongzhi Hu, Daniel M. Schaadt, and Andreas Rosenauer. Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images. Ultramicroscopy, 131(0):1-9, 2013. ISSN: 0304-3991. [WWW] [doi:10.1016/j.ultramic.2013.03.018] Keyword(s): HAADF-STEM.



20. T Mehrtens, M Schowalter, D Tytko, P Choi, D Raabe, L Hoffmann, H Jönen, U Rossow, A Hangleiter, and A Rosenauer. Measuring composition in InGaN from HAADF-STEM images and studying the temperature dependence of Z-contrast. Journal of Physics: Conference Series, 471(1):012009, 2013. [WWW] [doi:10.1088/1742-6596/471/1/012009]



21. K Müller, H Ryll, I Ordavo, M Schowalter, J Zweck, H Soltau, S Ihle, L Strüder, K Volz, P Potapov, and A Rosenauer. STEM strain analysis at sub-nanometre scale using millisecond frames from a direct electron read-out CCD camera. Journal of Physics: Conference Series, 471(1):012024, 2013. [WWW]



22. M Tewes, F F Krause, K Müller, P Potapov, M Schowalter, T Mehrtens, and A Rosenauer. Quantitative Composition Evaluation from HAADF-STEM in GeSi/Si Heterostructures. Journal of Physics: Conference Series, 471(1):012011, 2013. [WWW]



23. Thorsten M. Gesing, Marco Schowalter, Claudia Weidenthaler, M. Mangir Murshed, Gwilherm Nenert, Cecilia B. Mendive, Mariano Curti, Andreas Rosenauer, J.-Christian Buhl, Hartmut Schneider, and Reinhard X. Fischer. Strontium doping in mullite-type bismuth aluminate: a vacancy investigation using neutrons, photons and electrons. J. Mater. Chem., 22:18814-18823, 2012. [doi:10.1039/C2JM33208F]



24. Tim Grieb, Knut Müller, Oleg Rubel, Rafael Fritz, Claas Gloistein, Nils Neugebohrn, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. Determination of Nitrogen Concentration in Dilute GaNAs by STEM HAADF Z-Contrast Imaging and improved STEM-HAADF strain state analysis. Ultramicroscopy, 117:15-23, 2012. [WWW] [doi:10.1016/j.ultramic.2012.03.014]



25. Thorsten Mehrtens, Stephanie Bley, Parlapalli Venkata Satyam, and Andreas Rosenauer. Optimization of the preparation of GaN-based specimens with low-energy ion milling for (S)TEM. Micron, 43(8):902-909, 2012. [WWW] Keyword(s): Scanning transmission electron microscopy, Focused ion beam, Argon ion milling, Low-energy ion milling, Stopping and range of ions in matter.



26. A. Rath, J. K. Dash, R. R. Juluri, M. Schowalter, K. Müller, A. Rosenauer, and P. V. Satyam. Nano scale phase separation in Au-Ge system on ultra clean Si (100) surfaces. Journal of Applied Physics, 111:104319, 2012. [WWW] [doi:10.1063/1.4721666]



27. W. Van den Broek, A. Rosenauer, B. Goris, G.T. Martinez, S. Bals, S. Van Aert, and D. Van Dyck. Correction of non-linear thickness effects in HAADF STEM electron tomography. Ultramicroscopy, 116(0):8-12, 2012. ISSN: 0304-3991. [WWW] [doi:10.1016/j.ultramic.2012.03.005] Keyword(s): HAADF STEM tomography.



28. J. K. Dash, A. Rath, R. R. Juluri, P. Santhana Raman, K. Müller, M. Schowalter, R. Imlau, A. Rosenauer, and P. V. Satyam. Shape transformation of SiGe structures on ultra clean Si(5 5 7) and Si(5 5 12) surfaces. Journal of Physics: Conference Series, 326(1):012021, 2011. [WWW]



29. Tim Grieb, Knut Müller, Oleg Rubel, Rafael Fritz, Claas Gloistein, Nils Neugebohrn, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. Determination of Nitrogen Concentration in Dilute GaNAs by STEM HAADF Z-Contrast Imaging. Journal of Physics: Conference Series, 326(1):012033, 2011. [WWW]



30. Vincenco Grillo, Knut Müller, Frank Glas, Kerstin Volz, and Andreas Rosenauer. Toward Simultaneous Assessment of In and N in InGaAsN Alloys by Quantitative STEM-ADF Imaging. Microscopy and Microanalysis, 17:1862-1863, 7 2011. ISSN: 1435-8115. [WWW] [doi:10.1017/S143192761101018X]



31. Thorsten Mehrtens, Stephanie Bley, Marco Schowalter, Kathrin Sebald, Moritz Seyfried, Jürgen Gutowski, Stephan S A Gerstl, Pyuck-Pa Choi, Dierk Raabe, and Andreas Rosenauer. A (S)TEM and atom probe tomography study of InGaN. Journal of Physics: Conference Series, 326(1):012029, 2011. ISSN: 1742-6596. [WWW]



32. Andreas Rosenauer, Thorsten Mehrtens, Knut Müller, Katharina Gries, Marco Schowalter, Stephanie Bley, Parlapalli Venkata Satyam, Adrian Avramescu, Karl Engl, and Stephan Lutgen. 2D-composition mapping in InGaN without electron beam induced clustering of indium by STEM HAADF Z-contrast imaging. Journal of Physics: Conference Series, 326(1):012040, 2011. [WWW]



33. Andreas Rosenauer, Thorsten Mehrtens, Knut Müller, Katharina Gries, Marco Schowalter, Parlapalli Venkata Satyam, Stephanie Bley, Christian Tessarek, Detlef Hommel, Katrin Sebald, Moritz Seyfried, Jürgen Gutowski, Adrian Avramescu, Karl Engl, and Stephan Lutgen. Composition mapping in InGaN by scanning transmission electron microscopy. Ultramicroscopy, 111:1316-1327, 2011. ISSN: 0304-3991. [WWW] Keyword(s): Quantitative STEM, Composition determination, Multislice simulation, Frozen lattice simulation.



34. Andreas Rosenauer, Katharina Gries, Knut Müller, Angelika Pretorius, Marco Schowalter, Adrian Avramescu, Karl Engl, and Stephan Lutgen. Measurement of specimen thickness and composition in AlGaN/GaN using high-angle annular dark field images. Ultramicroscopy, 109(9):1171-1182, 2009. ISSN: 0304-3991. [WWW] [doi:10.1016/j.ultramic.2009.05.003] Keyword(s): Quantitative STEM Z-contrast imaging.



35. J. Pizarro, P.L. Galindo, E. Guerrero, A. Yanez, M. P. Guerrero, A. Rosenauer, D. L. Sales, and S.I. Molina. Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures. Applied Physics Letters, 93(15):153107-153107-3, 2008. ISSN: 0003-6951. [doi:10.1063/1.2998656] Keyword(s): indium compounds, nanowires, scanning electron microscopy, semiconductor quantum wires, 6146Km, 6837Hk, 6865La.

1. Florian F. Krause, Marco Schowalter, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Measurement of Diffraction Pattern Distortions for Quantitative STEM (Poster). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



2. C. Mahr, K. Müller-Caspary, A. Oelsner, A. Rosenauer, and P. Potapov. STEM strain measurement from a stream of diffraction patterns recorded on a pixel-free delay-line detector [Talk]. In EMAG conference 2016, Durham, UK, 2016.



3. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Martial Duchamp, Tim Grieb, Marco Schowalter, Stefan Löffler, Oliver Oppermann, Vadim Migunov, Florian Winkler, Heike Soltau, Lothar Strüder, Josef Zweck, Peter Schattschneider, Rafal Dunin-Borkowski, Johan Verbeeck, and Andreas Rosenauer. Momentum-resolved STEM: Measurement of atomic electric fields and angular multi-range analysis [Invited talk]. In The XXXVII Annual Meeting of the Electron Microscopy Society of India - International Conference on Electron Microscopy, 2016. Keyword(s): DPC, iris, picodiffraction, electric fields, ARSTEM.



4. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Martial Duchamp, Marco Schowalter, Stefan Löffler, Vadim Migunov, Florian Winkler, Martin Huth, Robert Ritz, Sebastian Ihle, Martin Simson, Henning Ryll, Heike Soltau, Lothar Strüder, Josef Zweck, Peter Schattschneider, Rafal Dunin-Borkowski, Johan Verbeeck, and Andreas Rosenauer. Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors. In Microscopy and Microanalysis 2016, Columbus (OH/USA), [Invited Talk], volume 22, pages 484-485, July 24-28th 2016. Microscopy Society of America. [WWW] [doi:10.1017/S1431927616003275] Keyword(s): DPC, pnccd.



5. Knut Müller-Caspary, Thorsten Mehrtens, Marco Schowalter, Tim Grieb, Andreas Rosenauer, Florian F. Krause, Christoph Mahr, and Pavel Potapov. ImageEval. A software for the processing, evaluation and acquisition of (S)TEM images. In European Microscopy Congress 2016, Lyon (F), [Poster IM03-286], 2016. [doi:10.1002/EMC2016.0677]



6. Knut Müller-Caspary, Andreas Oelsner, and Pavel Potapov. STEM Strain Measurement From a Stream of Diffraction Patterns Recorded on a Pixel-Free Delay-Line Detector. In Microscopy and Microanalysis 2016, Columbus (OH/USA), [Poster], July 24-28th 2016.



7. Knut Müller-Caspary, Andreas Oelsner, Pavel Potapov, and Thomas Schmidt. Analysis of strain and composition in GeSi/Si heterostructures by electron microscopy. In European Microscopy Congress 2016, Lyon (F), [Talk MS03-OP239], 2016. [doi:10.1002/EMC2016.0311]



8. Knut Müller-Caspary, Oliver Oppermann, Tim Grieb, Andreas Rosenauer, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Pavel Potapov, Andreas Beyer, and Kerstin Volz. Angle-resolved Scanning Transmission Electron Microscopy (ARSTEM) for materials analysis. In European Microscopy Congress 2016, Lyon (F), [Poster IM06-350], 2016. [doi:10.1002/EMC2016.0259]



9. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, T. Mehrtens, A. Beche, J. Verbeeck, V. Galioit, J. Zweck, Stefan Löffler, and Peter Schattschneider. Quantitative STEM - From composition to atomic electric fields (Invited Talk). In Electron Microscopy and Analysis Group Annual Conference (EMAG 2016), Durham (UK), 2016.



10. Andreas Rosenauer, Knut Müller-Caspary, Marco Schowalter, Tim Grieb, Florian F. Krause, Thorsten Mehrtens, Armand Beche, Johan Verbeeck, Josef Zweck, Stefan Löffler, Peter Schattschneider, Marcus Müller, Peter Veit, Sebastian Metzner, Frank Bertram, Tilman Schimpke, Martin Strassburg, and Rafal Dunin-Borkowski. Quantitative STEM -- From composition to atomic electric fields [Invited Talk]. In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



11. Marco Schowalter, Beeke Geerken, Florian Fritz Krause, Tim Grieb, Knut Müller-Caspary, Christoph Mahr, Thorsten Mehrtens, Andreas Rosenauer, and Sandra Van Aert. Atom-counting in a non-probe corrected STEM (Poster). In European Microscopy Congress 2016 (EMC 2016), Lyon (F), 2016.



12. Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F. Krause, Andreas Rosenauer, and Peter van Aken. Sample tilt effects on atom column position determination in ABF-STEM imaging. In Microscopy and Microanalysis Conference M&M 2016, Columbus (Ohio, USA), session A15.1, [Talk 19], July 24-28th 2016.



13. F F Krause, A Rosenauer, Müller K., M Schowalter, and T Mehrtens. Imaging STEM: A novel method for microscopy of semiconductors at ultra-high spatial resolution and precision (Talk). In Proceedings of Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK), volume Session 4b (Wed, April 1st), 2015.



14. Florian Fritz Krause, Andreas Rosenauer, Knut Müller-Caspary, Marco Schowalter, and Thorsten Mehrtens. Conventional Transmission Electron Microscopy Imaging beyond the Diffraction and Information Limits. In Frontiers of Electron Microscopy in Materials Science (FEMMS) 2015, Lake Tahoe (CA/USA), [Invited Talk], September 13-18th 2015.



15. Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. A quantum mechanical approach to electron picodiffraction reveals atomic electric fields. In Materials Research Society Spring Meeting 2015 (MRS 2015), San Francisco (USA) [Talk], volume Symposium ZZ, Talk 2.02, 2015.



16. Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields. In Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK) [Talk], volume Session 4b (Wed, April 1st), 2015.



17. Knut Müller, Andreas Oelsner, Andreas Rosenauer, and Pavel Potapov. STEM strain measurement from a stream of diffraction patterns recorded on a pixel-free delay-line detector. In Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK) [Poster], volume Poster Session 2, Poster P 2.5 (Tue, March 31st), 2015.



18. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Oliver Oppermann, Tim Grieb, Andreas Oelsner, Pavel Potapov, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields. In Frontiers of Electron Microscopy in Materials Science (FEMMS) 2015, Lake Tahoe (CA/USA), [Invited Talk], September 13-18th 2015.



19. K. Müller-Caspary, Andreas Oelsner, Andreas Rosenauer, and Pavel Potapov. STEM strain measurement from a stream of diffraction patterns recorded on a pixel-free delay-line detector. In Microscopy Conference MC 2015, Göttingen (D), session IM 1, [Poster IM1.P029], September 6-11th 2015.



20. Andreas Rosenauer, Florian F. Krause, Knut Müller, Marco Schowalter, and Thorsten Mehrtens. Conventional Transmission Electron Microscopy Imaging beyond the Diffraction and Information Limits. In Materials Research Society Spring Meeting 2015 (MRS 2015), San Francisco (USA) [Talk], volume Symposium ZZ, Talk 2.02, 2015.



21. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F. F. Krause, and T. Mehrtens. Analysis of composition and strain in semiconductor nanostructures by quantitative STEM using HAADF intensity, angular multi-range analysis and imaging STEM. In Microscopy Conference MC 2015, Göttingen (D), Session MS 2 [Invited Talk], September 6-11th 2015.



22. A. Rosenauer, K. Müller-Caspary, M. Schowalter, T. Grieb, F.F. Krause, T. Mehrtens, A. Béché, J. Verbeeck, V. Galioit, J. Zweck, Stefan Löffler, and Peter Schattschneider. Quantitative STEM. In Proceedings of the International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices 2015 (IAMNANO 2015) [Invited Talk], Hamburg (D), 2015.



23. Marco Schowalter, Florian F. Krause, Tim Grieb, Knut Müller-Caspary, Thorsten Mehrtens, and Andreas Rosenauer. Investigation of detector characteristics for quantification of HAADF-STEM images (Poster). In Proceedings of Microscopy of Semiconducting Materials 2015 (MSM XIX), Cambridge (UK), 2015.



24. M. Schowalter, A. Rosenauer, K. Müller-Caspary, T. Grieb, and T. Mehrtens. Quantitative STEM. In EAgLE workshop on high-resolution transmission electron microscopy - from sample preparation to interpretation, 21.-25. September 2015, Warsaw, Poland (invited talk), 2015.



25. M. Simson, H. Banba, R. Hartmann, M. Huth, S. Ihle, L. Jones, Y. Kondo, K. Müller, P. D. Nellist, H. Ryll, R. Sagawa2, J. Schmidt, H. Soltau, L. Strüder, and H. Yang. 4D-STEM imaging with the pnCCD (S)TEM-Camera. In Microscopy and Microanalysis (M&M, Portland, USA) [Talk], 2015.



26. M. Simson, R. E. Dunin-Borkowski, C. Dwyer, R. Hartmann, M. Huth, S. Ihle, P. Kotula, V. Migunov, K. Müller-Caspary, A. Rosenauer, H. Ryll, J. Schmidt, H. Soltau, L. Strüder, and M. Wollgarten. The pnCCD (S)TEM Camera - A Pixelated, Fast and Direct Detector for TEM and STEM. In PICO conference 2015: Frontiers of aberration-corrected electron microscopy, Kasteel Vaalsbroek (The Netherlands) [Poster], 2015.



27. Martin Simson, Henning Ryll, R. Hartmann, Martin Huth, Sebastian Ihle, Lewis Jones, Y. Kondo, Knut Müller, Peter D. Nellist, R. Sagawa, J. Schmidt, Heike Soltau, Lothar Strder, and Hao Yang. Fast STEM imaging with the pixelated pnCCD (S)TEM-camera. In Microscopy Conference MC 2015, Göttingen (D), session IM 1, [Poster IM1.P012], September 6-11th 2015.



28. Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F. Krause, Andreas Rosenauer, and Peter van Aken. Effects of small sample tilt on atomic column position determination in ABF-STEM imaging. In Microscopy Conference MC 2015, Göttingen (D), session IM 2, [Poster IM2.P055], September 6-11th 2015.



29. Josef Zweck, Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Peter Schattschneider, and Andreas Rosenauer. Exploring the space between atoms: Interatomic electric fields imaged by STEM-DPC. In Multinational Congress on Microscopy (MCM) 2015, Eger (Hungary) [Invited talk], 2015.



30. T Grieb, Müller K., Mahr C., Cadel E., Beyer A., Talbot E., Schowalter M., Volz K., and Rosenauer A.. A Method to Analyse the Chemical Composition in (InGa)(NAs) based on Evaluation of HAADF Intensity in STEM. In 18th International Microscopy Congress (IMC) [Talk IT-2-O-2414], 2014.



31. C. Mahr, K. Müller, D. Erben, M. Schowalter, J. Zweck, K. Volz, and A. Rosenauer. Strain Analysis by Nano-Beam Electron Diffraction (SANBED) in semiconductor nanostructures. In 18th International Microscopy Congress (IMC) [Poster IT-9-P-3029], 2014.



32. Knut Müller, Henning Ryll, Ivan Ordavo, Sebastian Ihle, Martin Huth, Martin Simson, Josef Zweck, Kerstin Volz, Heike Soltau, Andreas Rosenauer, Pavel Potapov, Marco Schowalter, Lothar Strüder, Christoph Mahr, and Daniel Erben. Strain Analysis from Nano-beam Electron Diffraction Patterns Recorded on Direct Electron Charge-coupled Devices. In Microscience Microscopy Congress, MMC 2014, Manchester (UK), July, 2014 [invited talk PS3.1.4], 2014.



33. Andreas Rosenauer, Knut Müller, Thorsten Mehrtens, Marco Schowalter, Timo Aschenbrenner, Carsten Kruse, Detlef Hommel, Lars Hoffmann, Andreas Hangleiter, Pyuck-Pa Choi, and Dierk Raabe. Measurement of the indium concentration in high-indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography. In SPIE Photonics West OPTO, San Francisco (USA) [Invited Talk], 2014.



34. Andreas Rosenauer, Knut Müller, Thorsten Mehrtens, Marco Schowalter, Moritz Tewes, Timo Aschenbrenner, Carsten Kruse, Detlef Hommel, Pyuck-Pa Choi, Dierk Raabe, and Pavel Potapov. Measurement of Composition with Quantitative STEM. In EMSI-2014, Delhi (India) [Invited Talk], 2014.



35. M. Schowalter, F. Krause, T. Grieb, T. Mehrtens, K. Müller, and A. Rosenauer. Position resolved single electron response of the HAADF-STEM detector and improved method for intensity normalisation. In 18th International Microscopy Congress (IMC) [Talk IT-2-O-3292], 2014.



36. Tim Grieb, Knut Müller, Emanuel Cadel, Rafael Fritz, Nils Neugebohrn, Etienne Talbot, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. Chemical composition analysis of dilute GaNAs and InGaNAs by high-angle annular dark field STEM. In International Conference on Electron Microscopy and XXIV Annual Meeting of the Electron Microscope Society of India (EMSI) 2013, Kolkata (India) [Talk], 2013.



37. T. Grieb, K. Müller, E. Cadel, R. Fritz, E. Talbot, M. Schowalter, K. Volz, and A. Rosenauer. Determination of In and N concentration in (InGa)(NAs) quantum wells using HAADF STEM and investigation of annealing effects. In Proceedings of the Microscopy Conference 2013 (MC 2013, Regensburg) Germany [Poster], volume 1: Instrumentation and Methods, pages IM.1.P024, 2013.



38. T. Grieb, K. Müller, R. Fritz, V. Grillo, M. Schowalter, K. Volz, and A. Rosenauer. Avoiding surface strain field induced artifacts in 2d chemical mapping of dilute GaNAs quantum wells by HAADF STEM. In Proceedings of the Microscopy Conference 2013 (MC 2013, Regensburg) Germany [Poster], volume 1: Instrumentation and Methods, pages IM.1.P008, 2013.



39. Thorsten Mehrtens, Marco Schowalter, Darius Tytko, Pyuck-Pa Choi, Dierk Raabe, Lars Hoffmann, Holger Jönen, Uwe Rossow, Andreas Hangleiter, and Andreas Rosenauer. Measuring composition in InGaN from HAADF-STEM images and studying the temperature dependence of Z-Contrast. In Microscopy of Semiconducting Materials 2013 (MSM XVIII),Oxford (UK) [Talk], 2013.



40. Knut Müller, Henning Ryll, Ivan Ordavo, Marco Schowalter, Josef Zweck, Heike Soltau, Sebastian Ihle, Lothar Strüder, Kerstin Volz, Pavel Potapov, and Andreas Rosenauer. STEM strain analysis at sub-nanometre scale using millisecond frames of a direct electron read-out CCD camera. In Microscopy of Semiconducting Materials 2013 (MSM XVIII),Oxford (UK) [Talk], volume G: Scanning Electron and Ion Beam Techniques, 2013.



41. Andreas Rosenauer. Introduction to STEM and the Multislice Method. In Advanced School on Transmission Electron Microscopy (2013) March 4-8 2013, Institute of Physics, Bhubaneswar, India [invited talk], 2013.



42. Andreas Rosenauer. Simulation of STEM images. In Advanced School on Transmission Electron Microscopy (2013) March 4-8 2013, Institute of Physics, Bhubaneswar, India [invited talk], 2013.



43. A. Rosenauer, K. Müller, T. Mehrtens, M. Schowalter, A. Würfel, T. Aschenbrenner, C. Kruse, D. Hommel, L. Hoffmann, A. Hangleiter, Pyuck-Pa Choi, and D. Raabe. Quantitative Methods in TEM and STEM. In , 2013.



44. Marco Schowalter, Ingo Stoffers, Florian Krause, Thorsten Mehrtens, Knut Müller, Malte Fandrich, Timo Aschenbrenner, Detlef Hommel, and Andreas Rosenauer. Composition determination using HAADF-STEM in AlGaN/GaN heterostructures revisited. In Microscopy Conference 2013 (MC 2013, Regensburg) [Poster Presentation], volume 1: Instrumentation and Methods, pages IM.1.P028, 2013.



45. Ingo Stoffers, Marco Schowalter, Florian Krause, Thorsten Mehrtens, Knut Müller, Malte Fandrich, Timo Aschenbrenner, Detlef Hommel, and Andreas Rosenauer. Composition quantification from HAADF-STEM in AlGaN/GaN heterostructures revisited. In Microscopy of Semiconducting Materials 2013 (MSMX VIII),Oxford (UK) [Poster Presentation], 2013.



46. Moritz Tewes, Florian Krause, Knut Müller, Pavel Potapov, Marco Schowalter, Thorsten Mehrtens, and Andreas Rosenauer. Quantitative Composition Evaluation from HAADF-STEM in GeSi/Si Heterostructures. In Microscopy of Semiconducting Materials 2013 (MSM XVIII),Oxford (UK) [Talk], 2013.



47. Tim Grieb, Knut Müller, Rafael Fritz, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. A method to avoid strain field induced artifacts in 2D chemical mapping of dilute GaNAs by HAADF STEM. In Microscopy and Microanalysis [Talk 595], volume 18, pages 1028-1029, 2012. [doi:10.1017/S143192761200699X]



48. Tim Grieb, Knut Müller, Rafael Fritz, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. A new method for true 2d chemical mapping: strain-field unaffected evaluation of dilute GaNAs by HAADF STEM. In Microscopy and Microanalysis (M&M) conference 2012, Phoenix (USA) [Poster], 2012.



49. Tim Grieb, Knut Müller, Andreas Hyra, Rafael Fritz, Marco Schowalter, Nicolai Knaub, and Andreas Rosenauer. Chemical analysis of InGaNAs quantum wells using HAADF STEM. In EMC 2012 [Poster], Session PS1.2: Thin films, Coatings and Interface, Manchester (UK), 2012. [WWW]



50. Lars Hoffmann, Heiko Bremers, Holger Jönen, Uwe Rossow, Thorsten Mehrtens, Marco Schowalter, Andreas Rosenauer, and Andreas Hangleiter. STEM and XRD investigations of ultra thin GaInN/GaN quantum wells with high indium content. In Verhandlungen der DPG, number HL 64.6, pages 240, 2012.



51. L. Hoffmann, H. Bremers, H. Jönen, U. Rossow, T. Mehrtens, M. Schowalter, A. Rosenauer, and A. Hangleiter. STEM and XRD investigations of ultra-thin GaInN/GaN quantum wells with high indium content. In International Workshop on Nitride Semiconductors 2012 [Talk], 2012.



52. Knut Müller, Andreas Rosenauer, Marco Schowalter, Josef Zweck, Rafael Fritz, and Kerstin Volz. Strain analysis by nano-beam electron diffraction (SANBED) in semiconductor nanostructures [Invited talk]. In The XXXIII Annual Meeting of the Electron Microscopy Society of India, pages 36, 2012. Keyword(s): SANBED.



53. Knut Müller, Andreas Rosenauer, Marco Schowalter, Josef Zweck, Rafael Fritz, and Kerstin Volz. Strain measurement in semiconductor nanostructures by convergent electron nanoprobe diffraction [Talk]. In Verhandlungen der Deutschen Physikalischen Gesellschaft, volume 47, pages 312, 2012.



54. Andreas Rosenauer, Knut Müller, Thorsten Mehrtens, Marco Schowalter, Alexander Würfel, Timo Aschenbrenner, Carsten Kruse, Detlef Hommel, Lars Hoffmann, Andreas Hangleiter, S. A. Gerstl, Pyuck-Pa Choi, and Dirk Raabe. Measurement of composition and strain in InGaN quantum dots by STEM [Plenary talk]. In The XXXIII Annual Meeting of the Electron Microscopy Society of India, EMSI2012, Bengaluru (Indien), July 4, 2012 [invited talk], pages 25, 2012.



55. A. Rosenauer, K. Müller, T. Mehrtens, M. Schowalter, J. Zweck, R. Fritz, and K. Volz. Measurement of Composition and Strain by STEM. In International Conference on Extended Defects in Semiconductors, EDS 2012, Thessaloniki (Greece) [Invited Talk], 2012.



56. Andreas Rosenauer, Knut Müller, Thorsten Mehrtens, Marco Schowalter, Josef Zweck, Rafael Fritz, and Kerstin Volz. Measurement of composition and strain by STEM. In Microscopy and Microanalysis 2012 (M&M2012), Phoenix, Arizona, July 29-August 2 [Invited talk], volume 18, pages 1804-1805, 2012. [doi:10.1017/S1431927612010872]



57. Alexander Würfel, Thorsten Mehrtens, Christian Tessarek, Timo Aschenbrenner, Detlef Hommel, and Andreas Rosenauer. Untersuchung von InGaN-basierten Quantenpunktsystemen mittels STEM Z-Kontrast. In Verhandlungen der DPG, number HL 25.15, pages 223, 2012.



58. K. Frank, A. Rosenauer, A. Wittstock, B. Neumann, and M. Bäumer. STEM - tomography of nanoporous gold. In poster IM3.P144 MC 2011, Kiel, Germany [poster], 2011.



59. R. Fritz, A. Beyer, W. Stolz, O. Rubel, T. Grieb, K. Müller, M. Schowalter, A. Rosenauer, I. Häusler, A. Mogilatenko, H. Kirmse, W. Neumann, and K. Volz. HAADF-STEM in a JEOL 2200FS for quantitative analysis of composition in compound III/V semiconductor materials. In W. Jäger, W. Kaysser, W. Benecke, W. Depmeier, S. Gorb, L. Kienle, M. Mulisch, D. Häussler, and A. Lotnyk, editors, Proceedings of the Microscopy Conference 2011 (MC 2011, Kiel), volume 1: Instrumentation and Methods, pages IM2.P130, 2011. DGE - German Society for Electron Microscopy.



60. Rafael Fritz, Andreas Beyer, Wolfgang Stolz, Kerstin Volz, Knut Müller, Marco Schowalter, Andreas Rosenauer, Ines Häusler, Anna Mogilatenko, Holm Kirmse, and Wolfgang Neumann. Quantitative analysis of chemical composition using HAADF -STEM in a JEOL 2200FS. In Microscopy of semiconducting materials, Cambridge (UK) [Talk], 2011.



61. T. Grieb, K. Müller, O. Rubel, R. Fritz, C. Gloistein, N. Neugebohrn, M. Schowalter, K. Volz, and A. Rosenauer. Determination of Nitrogen concentration in dilute GaNAs by STEM HAADF Z-contrast imaging. In MSM 2011 Cambridge, U.K. [talk] talk D13, 2011.



62. Tim Grieb, Knut Müller, Oleg Rubel, Rafael Fritz, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer. Determination of nitrogen concentration in dilute GaNAs by STEM HAADF Z-contrast imaging. In DPG Frühjahrstagung, Dresden (Germany) [Talk], 2011.



63. T. Grieb, K. Müller, O. Rubel, R. Fritz, M. Schowalter, K. Volz, and A. Rosenauer. STEM strain state analysis in combination with HAADF intensity evaluation to determine chemical composition of GaNAs quantum wells. In W. Jäger, W. Kaysser, W. Benecke, W. Depmeier, S. Gorb, L. Kienle, M. Mulisch, D. Häussler, and A. Lotnyk, editors, Proceedings of the Microscopy Conference 2011 (MC 2011, Kiel), volume 1: Instrumentation and Methods, pages IM2.P120, 2011. DGE - German Society for Electron Microscopy.



64. G.T. Martinez, S. Van Aert, J. Verbeeck, S. Bals, and A. Rosenauer. Quantitative interface characterization using model-based HAADF STEM. In poster IM2.P116 MC 2011, Kiel, Germany [poster], 2011.



65. Andreas Rosenauer. Composition mapping in InGaN with Quantitative STEM and comparison with atom probe measurements. In Invitied talk B2.1 ICNS 9 Glasgow, U.K. 2011 [invited talk], 2011.



66. A Rosenauer, T. Mehrtens, K. Müller, K. Gries, M. Schowalter, S. Bley, P. V. Satyam, A. Avramescu, K. Engl, and S. Lutgen. 2D-composition mapping in InGaN without electron beam induced clustering of indium by STEM HAADF Z-contrast imaging. In MSM 2011 Cambridge, U.K. [poster] poster 2.18, 2011.



67. A. Rosenauer, T. Mehrtens, K. Müller, K. Gries, M. Schowalter, S. Bley, P. V. Satyam, A. Avramescu, K. Engl, and S. Lutgen. Composition mapping in InGaN using HAADF STEM imaging. In W. Jäger, W. Kaysser, W. Benecke, W. Depmeier, S. Gorb, L. Kienle, M. Mulisch, D. Häussler, and A. Lotnyk, editors, Proceedings of the Microscopy Conference 2011 (MC 2011, Kiel), volume 1: Instrumentation and Methods, pages IM2.P113, 2011. DGE - German Society for Electron Microscopy.



68. Andreas Rosenauer, Thorsten Mehrtens, Knut Müller, Katharina Gries, Marco Schowalter, Stephanie Bley, Parlapalli Vencata Satyam, Christian Tessarek, Detlef Hommel, Kathrin Sebald, Moritz Seyfried, Jürgen Gutowski, Adrian Avramescu, Karl Engl, and Stephan Lutgen. Quantitative STEM: Composition mapping in InGaN. In DPG Frühjahrstagung, Dresden (Germany) [Invited talk], 2011.



69. A. Rosenauer, T. Mehrtens, K. Müller, K. Gries, M. Schowalter, P. V. Satyam, S. Bley, C. Tessarek, D. Hommel, K. Sebald, M. Seyfried, J. Gutowski, S. S. A. Gerstl, P. P. Choi, and D. Raabe. Composition mapping in InGaN with quantitative STEM Z-contrast imaging. In ICNS Glasgow 2011 [Invited talk], 2011.



70. A. Rosenauer, K. Müller, and M. Schowalter. STEMSIM-a software tool for simulation of STEM ADF Z-contrast imaging. In invited talk in the Workshop W4 Simulation for TEM and STEM MC 2011, Kiel, Germany [invited talk], 2011.



71. P. V. Satyam, A. Rosenauer, J. Dash, A. Rath, J. Raghava, M. Schowalter, Tim Grieb, K. M�ller, T. Mehrtens, and Robert Imlau. Compositional analysis of nanostructures with STEM Z-contrast imaging. In EM50, Hyderabad (India) [Talk], 2011.



72. M. Schowalter, M. Tewes, K. Frank, R. Imlau, A. Rosenauer, H.S. Lee, O.G. Rastelli, M. Schmidt, M. Tavast, T. Leinonen, and M. Guina. Investigation of diffusion in AlAs/GaAs distributed Bragg reflectors using HAADF STEM imaging. In MSM 2011 Cambridge, U.K. [poster] poster P2.12, 2011.



73. K. Volz, R. Fritz, A. Beyer, W. Stolz, K. Müller, M. Schowalter, A. Rosenauer, I. Haeusler, A. Mogilatenko, H. Kirmse, and W. Neumann. Quantitative analysis of chemical composition using HAADF-STEM in a JEOL 2200FS. In talk D11 MSM 2011 Cambridge, U.K. [talk], 2011.



74. Rafael Fritz, Andreas Beyer, Oleg Rubel, Wolfgang Stolz, Kerstin Volz, Knut Müller, Marco Schowalter, Andreas Rosenauer, Ines Häusler, Anna Mogilatenko, Holm Kirmse, and Wolfgang Neumann. Quantitative analysis of chemical composition in Ga(AsP)-heterostructures using HAADF-STEM in a JEOL 2200FS. In International Microscopy Congress (IMC17) Rio de Janeiro (Brazil) [Poster presentation], 2010.



75. Vincenzo Grillo, Frank Glas, Knut Müller, and Andreas Rosenauer. Simulation of STEM-HAADF microscopy images for the chemical quantification in InGaAsN alloys. In Transnational Access Meeting (TAM), Helsinki (Finland) [Poster presentation], 2010.



76. Thorsten Mehrtens, Marco Schowalter, Knut Müller, Dongzhi Hu, Daniel M. Schaadt, and Andreas Rosenauer. Measuring of segregation profiles from HAADF -STEM images. In International Microscopy Congress (IMC17), Rio de Janeiro (Brazil) [Poster presentation], 2010.



77. Andreas Rosenauer, Thorsten Mehrtens, Stephanie Bley, Knut Müller, Katharina Gries, Marco Schowalter, Christian Tessarek, Detlef Hommel, Kathrin Sebald, Moritz Seyfried, and Jürgen Gutowski. Composition mapping in InGaN quantum wells and quantum dots using high resolution STEM imaging. In International Microscopy Congress (IMC17), Rio de Janeiro (Brazil) [Poster presentation], 2010.



78. Thorsten Mehrtens, Knut Müller, Marco Schowalter, Nils Neugebohrn, Andreas Rosenauer, Dongzhi Hu, and Daniel Schaadt. Towards a quantitative concentration analysis in InGaAs-heterostructures using HAADF-STEM. In G. Kothleitner and M. Leisch, editors, MC2009, Graz (Austria) Vol. 1: Instrumentation and Methodology, pages 219-220, 2009.



79. Thorsten Mehrtens, Marco Schowalter, Knut Müller, Andreas Rosenauer, Dongzhi Hu, and Daniel Schaadt. Analysis of segregation profiles in InGaAs quantum wells via TEM and STEM. In Verhandlungen der DPG, number HL 1.6, 2009.



80. P. Galindo, J. Pizarro, A. Rosenauer, A. Yanez, E. Guerrero, and S. Molina. HAADF-STEM image simulation of large scale nanostructures. In M. Luysberg, K. Tillmann, T. Weirich (Eds.): EMC 2008, Instrumentation and Methods, volume 1, pages 111-112, 2008. [doi:10.1007/978-3-540-85156-1_56]



81. Andreas Rosenauer and Marco Schowalter. STEMSIM-a new software tool for simulation of STEM HAADF Z-contrast imaging. In A. G. Cullis and P. A. Midgley, editors, Springer Proceedings in Physics, volume 120, pages 169-172, 2007. Springer.

1. Knut Müller-Caspary. Applications and limitations of momentum-resolved STEM [Talk at the Meeting of the AK-HREM on High-resolution TEM, TU Berlin, Berlin(Germany)], April 2016.



2. Knut Müller-Caspary. Probing electric fields by STEM [Lecture], June 2015.



3. Knut Müller-Caspary and Andreas Rosenauer. STEM and TEM Simulation [Tutorial], June 2015.



4. Knut Müller. Evaluation of STEM images with the ImageEval software [Tutorial], January 2014.



5. Knut Müller. Practice of quantitative STEM [Lecture], January 2014.



6. Knut Müller. Simulation of STEM images [Lecture], January 2014.



7. Knut Müller. Simulation of STEM images with the STEMsim software [Tutorial], January 2014.



8. Knut Müller, Thorsten Mehrtens, Florian Krause, Marco Schowalter, and Andreas Rosenauer. Simulation of STEM images [Invited talk], February 2014.



9. Knut Müller and Andreas Rosenauer. Quantitative STEM simulation/Evaluation [Tutorial], September 2014.



10. Moritz Tewes. Quantitative STEM-Untersuchung von Germanium-Silizium-Heterostrukturen (Quantitative STEM investigations of germanium-silicon heterostructures). Master's thesis, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany, February 2013.



11. Knut Müller. Practice and Application of quantitative STEM [Lecture], March 2013.



12. Knut Müller and Andreas Rosenauer. Simulation of STEM images with the STEMsim software [Tutorial], March 2013.



13. Dennis Zillmann. Bestimmung der Modulationstransferfunktion einer CCD-Kamera und Kontrasttransfer in der Transmissionselektronenmikroskopie (Determination of the modulation transfer function of a CCD camera and contrast transfer in the field of transmission electron microscopy). Master's thesis, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany, October 2011.



14. Thorsten Mehrtens. Bestimmung von Segregationsprofilen in InGaAs/GaAs-Quantentrögen mittels konventioneller und Rastertransmissionselektronenmikroskopie. Master's thesis, Universität Bremen, 2009.



15. Nils Neugebohrn. Quantitative Untersuchung der Temperatur- und Dickenabhängigkeit des STEM-Dunkelfeldsignals von Zinkblende-Halbleitern (Quantitative investigation of the temperature and thickness dependence of the STEM dark field signal of zinc blende semiconductors), July 2009.

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