1. J. Schmidt, R. Hartmann, P. Holl, M. Huth, G. Lutz, K. Müller, A. Rosenauer, H. Ryll, S. Send, M. Simson, D. Steigenhöfer, J. Soltau, H. Soltau, and L. Strüder. Extending the dynamic range of fully depleted pnCCDs. Journal of Instrumentation, 9(10):P10008, 2014. [WWW] [doi:10.1088/1748-0221/9/10/P10008] Keyword(s): pnCCD, direct electron detection, CCD, fast, ultrafast.



2. K Müller, H Ryll, I Ordavo, M Schowalter, J Zweck, H Soltau, S Ihle, L Strüder, K Volz, P Potapov, and A Rosenauer. STEM strain analysis at sub-nanometre scale using millisecond frames from a direct electron read-out CCD camera. Journal of Physics: Conference Series, 471(1):012024, 2013. [WWW]

1. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Martial Duchamp, Marco Schowalter, Stefan Löffler, Vadim Migunov, Florian Winkler, Martin Huth, Robert Ritz, Sebastian Ihle, Martin Simson, Henning Ryll, Heike Soltau, Lothar Strüder, Josef Zweck, Peter Schattschneider, Rafal Dunin-Borkowski, Johan Verbeeck, and Andreas Rosenauer. Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors. In Microscopy and Microanalysis 2016, Columbus (OH/USA), [Invited Talk], volume 22, pages 484-485, July 24-28th 2016. Microscopy Society of America. [WWW] [doi:10.1017/S1431927616003275] Keyword(s): DPC, pnccd.



2. Knut Müller-Caspary, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Oliver Oppermann, Tim Grieb, Andreas Oelsner, Pavel Potapov, Johan Verbeeck, Josef Zweck, Peter Schattschneider, and Andreas Rosenauer. Quantum mechanical interpretation of electron picodiffraction reveals atomic electric fields. In Frontiers of Electron Microscopy in Materials Science (FEMMS) 2015, Lake Tahoe (CA/USA), [Invited Talk], September 13-18th 2015.



3. Knut Müller, Henning Ryll, Ivan Ordavo, Sebastian Ihle, Martin Huth, Martin Simson, Josef Zweck, Kerstin Volz, Heike Soltau, Andreas Rosenauer, Pavel Potapov, Marco Schowalter, Lothar Strüder, Christoph Mahr, and Daniel Erben. Strain Analysis from Nano-beam Electron Diffraction Patterns Recorded on Direct Electron Charge-coupled Devices. In Microscience Microscopy Congress, MMC 2014, Manchester (UK), July, 2014 [invited talk PS3.1.4], 2014.



4. H. Ryll, K. Müller, S. Ihle, H. Soltau, I. Ordavo, A. Liebel, R. Hartmann, A. Rosenauer, and L. Strüder. A new direct electron imaging camera for transmission electron microscopy based on an ultrafast pnCCD. In Proceedings of the Microscopy Conference 2013 (MC 2013, Regensburg) Germany [poster], volume 1: Instrumentation and Methods, pages IM.1.P029, 2013.



5. H. Ryll, K. Müller, S. Ihle, H. Soltau, I. Ordavo, A. Liebel, R. Hartmann, A. Rosenauer, and L. Strüder. Results of a pnCCD Based Ultrafast Direct Single Electron Imaging Camera for Transmission Electron Microscopy. In Proceedings of the Microscopy and Microanalysis Conference 2013 (MandM 2013, Indianapolis) USA [Talk], volume A14.04: New Instrumentation at the Limits: Characteristics and Applications, 2013.

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